The Aharonov-Bohm effect and its applications to electron phase microscopy

The Aharonov-Bohm effect was conclusively established by a series of our electron interference experiments, with the help of some advanced techniques, such as coherent field-emission electron beams and microlithography. Using this fundamental principle behind the interaction of an electron wave with...

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Detalles Bibliográficos
Autor principal: Tonomura, Akira
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Japan Academy 2006
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4323049/
https://www.ncbi.nlm.nih.gov/pubmed/25792772
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author Tonomura, Akira
author_facet Tonomura, Akira
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description The Aharonov-Bohm effect was conclusively established by a series of our electron interference experiments, with the help of some advanced techniques, such as coherent field-emission electron beams and microlithography. Using this fundamental principle behind the interaction of an electron wave with electromagnetic fields, new observation techniques were developed to directly observe microscopic objects and quantum phenomena previously unobservable.
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spelling pubmed-43230492015-03-19 The Aharonov-Bohm effect and its applications to electron phase microscopy Tonomura, Akira Proc Jpn Acad Ser B Phys Biol Sci Review The Aharonov-Bohm effect was conclusively established by a series of our electron interference experiments, with the help of some advanced techniques, such as coherent field-emission electron beams and microlithography. Using this fundamental principle behind the interaction of an electron wave with electromagnetic fields, new observation techniques were developed to directly observe microscopic objects and quantum phenomena previously unobservable. The Japan Academy 2006-04 /pmc/articles/PMC4323049/ /pubmed/25792772 Text en © 2006 The Japan Academy This is an open access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Review
Tonomura, Akira
The Aharonov-Bohm effect and its applications to electron phase microscopy
title The Aharonov-Bohm effect and its applications to electron phase microscopy
title_full The Aharonov-Bohm effect and its applications to electron phase microscopy
title_fullStr The Aharonov-Bohm effect and its applications to electron phase microscopy
title_full_unstemmed The Aharonov-Bohm effect and its applications to electron phase microscopy
title_short The Aharonov-Bohm effect and its applications to electron phase microscopy
title_sort aharonov-bohm effect and its applications to electron phase microscopy
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4323049/
https://www.ncbi.nlm.nih.gov/pubmed/25792772
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