Sub-100 nm resolution microscopy based on proximity projection grating scheme

Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projecti...

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Detalles Bibliográficos
Autores principales: Hu, Feng, Somekh, Michael G., Albutt, Darren J., Webb, Kevin, Moradi, Emilia, See, Chung W.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4341199/
https://www.ncbi.nlm.nih.gov/pubmed/25715953
http://dx.doi.org/10.1038/srep08589
Descripción
Sumario:Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.

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