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Sub-100 nm resolution microscopy based on proximity projection grating scheme

Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projecti...

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Detalles Bibliográficos
Autores principales:	Hu, Feng, Somekh, Michael G., Albutt, Darren J., Webb, Kevin, Moradi, Emilia, See, Chung W.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group 2015
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4341199/ https://www.ncbi.nlm.nih.gov/pubmed/25715953 http://dx.doi.org/10.1038/srep08589

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