A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 ×...

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Detalles Bibliográficos
Autores principales: Meier, Tobias, Förste, Alexander, Tavassolizadeh, Ali, Rott, Karsten, Meyners, Dirk, Gröger, Roland, Reiss, Günter, Quandt, Eckhard, Schimmel, Thomas, Hölscher, Hendrik
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2015
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4362309/
https://www.ncbi.nlm.nih.gov/pubmed/25821686
http://dx.doi.org/10.3762/bjnano.6.46

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4362309/
https://www.ncbi.nlm.nih.gov/pubmed/25821686
http://dx.doi.org/10.3762/bjnano.6.46

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