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Pure electron-electron dephasing in percolative aluminum ultrathin film grown by molecular beam epitaxy

We have successfully grown ultrathin continuous aluminum film by molecular beam epitaxy. This percolative aluminum film is single crystalline and strain free as characterized by transmission electron microscopy and atomic force microscopy. The weak anti-localization effect is observed in the tempera...

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Detalles Bibliográficos
Autores principales:	Lin, Shih-Wei, Wu, Yue-Han, Chang, Li, Liang, Chi-Te, Lin, Sheng-Di
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer US 2015
Materias:	Nano Express
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4385055/ https://www.ncbi.nlm.nih.gov/pubmed/25852367 http://dx.doi.org/10.1186/s11671-015-0782-x

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