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Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis

X-ray focus optimization and characterization based on coherent scattering and quantitative speckle size measurements was demonstrated at the Linac Coherent Light Source. Its performance as a single-pulse free-electron laser beam diagnostic was tested for two typical focusing configurations. The res...

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Autores principales: Sikorski, Marcin, Song, Sanghoon, Schropp, Andreas, Seiboth, Frank, Feng, Yiping, Alonso-Mori, Roberto, Chollet, Matthieu, Lemke, Henrik T., Sokaras, Dimosthenis, Weng, Tsu-Chien, Zhang, Wenkai, Robert, Aymeric, Zhu, Diling
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4416675/
https://www.ncbi.nlm.nih.gov/pubmed/25931074
http://dx.doi.org/10.1107/S1600577515004361
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author Sikorski, Marcin
Song, Sanghoon
Schropp, Andreas
Seiboth, Frank
Feng, Yiping
Alonso-Mori, Roberto
Chollet, Matthieu
Lemke, Henrik T.
Sokaras, Dimosthenis
Weng, Tsu-Chien
Zhang, Wenkai
Robert, Aymeric
Zhu, Diling
author_facet Sikorski, Marcin
Song, Sanghoon
Schropp, Andreas
Seiboth, Frank
Feng, Yiping
Alonso-Mori, Roberto
Chollet, Matthieu
Lemke, Henrik T.
Sokaras, Dimosthenis
Weng, Tsu-Chien
Zhang, Wenkai
Robert, Aymeric
Zhu, Diling
author_sort Sikorski, Marcin
collection PubMed
description X-ray focus optimization and characterization based on coherent scattering and quantitative speckle size measurements was demonstrated at the Linac Coherent Light Source. Its performance as a single-pulse free-electron laser beam diagnostic was tested for two typical focusing configurations. The results derived from the speckle size/shape analysis show the effectiveness of this technique in finding the focus’ location, size and shape. In addition, its single-pulse compatibility enables users to capture pulse-to-pulse fluctuations in focus properties compared with other techniques that require scanning and averaging.
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spelling pubmed-44166752015-05-20 Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis Sikorski, Marcin Song, Sanghoon Schropp, Andreas Seiboth, Frank Feng, Yiping Alonso-Mori, Roberto Chollet, Matthieu Lemke, Henrik T. Sokaras, Dimosthenis Weng, Tsu-Chien Zhang, Wenkai Robert, Aymeric Zhu, Diling J Synchrotron Radiat Free-Electron Lasers X-ray focus optimization and characterization based on coherent scattering and quantitative speckle size measurements was demonstrated at the Linac Coherent Light Source. Its performance as a single-pulse free-electron laser beam diagnostic was tested for two typical focusing configurations. The results derived from the speckle size/shape analysis show the effectiveness of this technique in finding the focus’ location, size and shape. In addition, its single-pulse compatibility enables users to capture pulse-to-pulse fluctuations in focus properties compared with other techniques that require scanning and averaging. International Union of Crystallography 2015-04-14 /pmc/articles/PMC4416675/ /pubmed/25931074 http://dx.doi.org/10.1107/S1600577515004361 Text en © Marcin Sikorski et al. 2015 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Free-Electron Lasers
Sikorski, Marcin
Song, Sanghoon
Schropp, Andreas
Seiboth, Frank
Feng, Yiping
Alonso-Mori, Roberto
Chollet, Matthieu
Lemke, Henrik T.
Sokaras, Dimosthenis
Weng, Tsu-Chien
Zhang, Wenkai
Robert, Aymeric
Zhu, Diling
Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis
title Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis
title_full Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis
title_fullStr Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis
title_full_unstemmed Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis
title_short Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis
title_sort focus characterization at an x-ray free-electron laser by coherent scattering and speckle analysis
topic Free-Electron Lasers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4416675/
https://www.ncbi.nlm.nih.gov/pubmed/25931074
http://dx.doi.org/10.1107/S1600577515004361
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