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Characterization of nanostructured ZnO thin films deposited through vacuum evaporation
This work presents a novel technique to deposit ZnO thin films through a metal vacuum evaporation technique using colloidal nanoparticles (average size of 30 nm), which were synthesized by our research group, as source. These thin films had a thickness between 45 and 123 nm as measured by profilomet...
Autores principales: | Alvarado, Jose Alberto, Maldonado, Arturo, Juarez, Héctor, Pacio, Mauricio, Perez, Rene |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4419655/ https://www.ncbi.nlm.nih.gov/pubmed/25977868 http://dx.doi.org/10.3762/bjnano.6.100 |
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