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Serial snapshot crystallography for materials science with SwissFEL
New opportunities for studying (sub)microcrystalline materials with small unit cells, both organic and inorganic, will open up when the X-ray free electron laser (XFEL) presently being constructed in Switzerland (SwissFEL) comes online in 2017. Our synchrotron-based experiments mimicking the 4%-ener...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4420546/ https://www.ncbi.nlm.nih.gov/pubmed/25995845 http://dx.doi.org/10.1107/S2052252515006740 |
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author | Dejoie, Catherine Smeets, Stef Baerlocher, Christian Tamura, Nobumichi Pattison, Philip Abela, Rafael McCusker, Lynne B. |
author_facet | Dejoie, Catherine Smeets, Stef Baerlocher, Christian Tamura, Nobumichi Pattison, Philip Abela, Rafael McCusker, Lynne B. |
author_sort | Dejoie, Catherine |
collection | PubMed |
description | New opportunities for studying (sub)microcrystalline materials with small unit cells, both organic and inorganic, will open up when the X-ray free electron laser (XFEL) presently being constructed in Switzerland (SwissFEL) comes online in 2017. Our synchrotron-based experiments mimicking the 4%-energy-bandpass mode of the SwissFEL beam show that it will be possible to record a diffraction pattern of up to 10 randomly oriented crystals in a single snapshot, to index the resulting reflections, and to extract their intensities reliably. The crystals are destroyed with each XFEL pulse, but by combining snapshots from several sets of crystals, a complete set of data can be assembled, and crystal structures of materials that are difficult to analyze otherwise will become accessible. Even with a single shot, at least a partial analysis of the crystal structure will be possible, and with 10–50 femtosecond pulses, this offers tantalizing possibilities for time-resolved studies. |
format | Online Article Text |
id | pubmed-4420546 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2015 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-44205462015-05-20 Serial snapshot crystallography for materials science with SwissFEL Dejoie, Catherine Smeets, Stef Baerlocher, Christian Tamura, Nobumichi Pattison, Philip Abela, Rafael McCusker, Lynne B. IUCrJ Research Papers New opportunities for studying (sub)microcrystalline materials with small unit cells, both organic and inorganic, will open up when the X-ray free electron laser (XFEL) presently being constructed in Switzerland (SwissFEL) comes online in 2017. Our synchrotron-based experiments mimicking the 4%-energy-bandpass mode of the SwissFEL beam show that it will be possible to record a diffraction pattern of up to 10 randomly oriented crystals in a single snapshot, to index the resulting reflections, and to extract their intensities reliably. The crystals are destroyed with each XFEL pulse, but by combining snapshots from several sets of crystals, a complete set of data can be assembled, and crystal structures of materials that are difficult to analyze otherwise will become accessible. Even with a single shot, at least a partial analysis of the crystal structure will be possible, and with 10–50 femtosecond pulses, this offers tantalizing possibilities for time-resolved studies. International Union of Crystallography 2015-04-21 /pmc/articles/PMC4420546/ /pubmed/25995845 http://dx.doi.org/10.1107/S2052252515006740 Text en © Catherine Dejoie et al. 2015 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
spellingShingle | Research Papers Dejoie, Catherine Smeets, Stef Baerlocher, Christian Tamura, Nobumichi Pattison, Philip Abela, Rafael McCusker, Lynne B. Serial snapshot crystallography for materials science with SwissFEL |
title | Serial snapshot crystallography for materials science with SwissFEL |
title_full | Serial snapshot crystallography for materials science with SwissFEL |
title_fullStr | Serial snapshot crystallography for materials science with SwissFEL |
title_full_unstemmed | Serial snapshot crystallography for materials science with SwissFEL |
title_short | Serial snapshot crystallography for materials science with SwissFEL |
title_sort | serial snapshot crystallography for materials science with swissfel |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4420546/ https://www.ncbi.nlm.nih.gov/pubmed/25995845 http://dx.doi.org/10.1107/S2052252515006740 |
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