Partial dark-field microscopy for investigating domain structures of double-layer microsphere film

A lateral dislocation in a double-layer microsphere film is very difficult to identify because the constituent domains have the same two-dimensional crystalline orientation. Orientation-sensitive optical techniques cannot resolve this issue. Here, we demonstrate that partial dark-field (pDF) optical...

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Detalles Bibliográficos
Autores principales: Heon Kim, Joon, Su Park, Jung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4426674/
https://www.ncbi.nlm.nih.gov/pubmed/25959375
http://dx.doi.org/10.1038/srep10157

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4426674/
https://www.ncbi.nlm.nih.gov/pubmed/25959375
http://dx.doi.org/10.1038/srep10157

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