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Partial dark-field microscopy for investigating domain structures of double-layer microsphere film
A lateral dislocation in a double-layer microsphere film is very difficult to identify because the constituent domains have the same two-dimensional crystalline orientation. Orientation-sensitive optical techniques cannot resolve this issue. Here, we demonstrate that partial dark-field (pDF) optical...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group
2015
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4426674/ https://www.ncbi.nlm.nih.gov/pubmed/25959375 http://dx.doi.org/10.1038/srep10157 |