Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy

We investigated the surface work function (W(S)) and its spatial distribution for epitaxial VO(2)/TiO(2) thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W(S) values, throughout the metal–in...

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Detalles Bibliográficos
Autores principales: Sohn, Ahrum, Kanki, Teruo, Sakai, Kotaro, Tanaka, Hidekazu, Kim, Dong-Wook
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4434847/
https://www.ncbi.nlm.nih.gov/pubmed/25982229
http://dx.doi.org/10.1038/srep10417
Descripción
Sumario:We investigated the surface work function (W(S)) and its spatial distribution for epitaxial VO(2)/TiO(2) thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W(S) values, throughout the metal–insulator transition. The metallic fraction, estimated from W(S) maps, describes the evolution of the resistance based on a two-dimensional percolation model. The KPFM measurements also revealed the fractal nature of the domain configuration.

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