Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy

We investigated the surface work function (W(S)) and its spatial distribution for epitaxial VO(2)/TiO(2) thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W(S) values, throughout the metal–in...

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Autores principales: Sohn, Ahrum, Kanki, Teruo, Sakai, Kotaro, Tanaka, Hidekazu, Kim, Dong-Wook
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4434847/
https://www.ncbi.nlm.nih.gov/pubmed/25982229
http://dx.doi.org/10.1038/srep10417
_version_ 1782371807647498240
author Sohn, Ahrum
Kanki, Teruo
Sakai, Kotaro
Tanaka, Hidekazu
Kim, Dong-Wook
author_facet Sohn, Ahrum
Kanki, Teruo
Sakai, Kotaro
Tanaka, Hidekazu
Kim, Dong-Wook
author_sort Sohn, Ahrum
collection PubMed
description We investigated the surface work function (W(S)) and its spatial distribution for epitaxial VO(2)/TiO(2) thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W(S) values, throughout the metal–insulator transition. The metallic fraction, estimated from W(S) maps, describes the evolution of the resistance based on a two-dimensional percolation model. The KPFM measurements also revealed the fractal nature of the domain configuration.
format Online
Article
Text
id pubmed-4434847
institution National Center for Biotechnology Information
language English
publishDate 2015
publisher Nature Publishing Group
record_format MEDLINE/PubMed
spelling pubmed-44348472015-05-28 Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy Sohn, Ahrum Kanki, Teruo Sakai, Kotaro Tanaka, Hidekazu Kim, Dong-Wook Sci Rep Article We investigated the surface work function (W(S)) and its spatial distribution for epitaxial VO(2)/TiO(2) thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W(S) values, throughout the metal–insulator transition. The metallic fraction, estimated from W(S) maps, describes the evolution of the resistance based on a two-dimensional percolation model. The KPFM measurements also revealed the fractal nature of the domain configuration. Nature Publishing Group 2015-05-18 /pmc/articles/PMC4434847/ /pubmed/25982229 http://dx.doi.org/10.1038/srep10417 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Sohn, Ahrum
Kanki, Teruo
Sakai, Kotaro
Tanaka, Hidekazu
Kim, Dong-Wook
Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy
title Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy
title_full Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy
title_fullStr Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy
title_full_unstemmed Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy
title_short Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy
title_sort fractal nature of metallic and insulating domain configurations in a vo(2) thin film revealed by kelvin probe force microscopy
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4434847/
https://www.ncbi.nlm.nih.gov/pubmed/25982229
http://dx.doi.org/10.1038/srep10417
work_keys_str_mv AT sohnahrum fractalnatureofmetallicandinsulatingdomainconfigurationsinavo2thinfilmrevealedbykelvinprobeforcemicroscopy
AT kankiteruo fractalnatureofmetallicandinsulatingdomainconfigurationsinavo2thinfilmrevealedbykelvinprobeforcemicroscopy
AT sakaikotaro fractalnatureofmetallicandinsulatingdomainconfigurationsinavo2thinfilmrevealedbykelvinprobeforcemicroscopy
AT tanakahidekazu fractalnatureofmetallicandinsulatingdomainconfigurationsinavo2thinfilmrevealedbykelvinprobeforcemicroscopy
AT kimdongwook fractalnatureofmetallicandinsulatingdomainconfigurationsinavo2thinfilmrevealedbykelvinprobeforcemicroscopy

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