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Fractal Nature of Metallic and Insulating Domain Configurations in a VO(2) Thin Film Revealed by Kelvin Probe Force Microscopy

We investigated the surface work function (W(S)) and its spatial distribution for epitaxial VO(2)/TiO(2) thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W(S) values, throughout the metal–in...

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Detalles Bibliográficos
Autores principales:	Sohn, Ahrum, Kanki, Teruo, Sakai, Kotaro, Tanaka, Hidekazu, Kim, Dong-Wook
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group 2015
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4434847/ https://www.ncbi.nlm.nih.gov/pubmed/25982229 http://dx.doi.org/10.1038/srep10417

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