Downscaling the Sample Thickness to Sub-Micrometers by Employing Organic Photovoltaic Materials as a Charge-Generation Layer in the Time-of-Flight Measurement

Time-of-flight (TOF) measurements typically require a sample thickness of several micrometers for determining the carrier mobility, thus rendering the applicability inefficient and unreliable because the sample thicknesses are orders of magnitude higher than those in real optoelectronic devices. Her...

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Detalles Bibliográficos
Autores principales: Liu, Shun-Wei, Lee, Chih-Chien, Su, Wei-Cheng, Yuan, Chih-Hsien, Lin, Chun-Feng, Chen, Kuan-Ting, Shu, Yi-Sheng, Li, Ya-Ze, Su, Tsung-Hao, Huang, Bo-Yao, Chang, Wen-Chang, Liu, Yu-Hsuan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4441200/
https://www.ncbi.nlm.nih.gov/pubmed/25999238
http://dx.doi.org/10.1038/srep10384

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