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Deep ultraviolet laser direct write for patterning sol-gel InGaZnO semiconducting micro/nanowires and improving field-effect mobility

Deep-UV (DUV) laser was used to directly write indium-gallium-zinc-oxide (IGZO) precursor solution and form micro and nanoscale patterns. The directional DUV laser beam avoids the substrate heating and suppresses the diffraction effect. A IGZO precursor solution was also developed to fulfill the req...

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Autores principales: Lin, Hung-Cheng, Stehlin, Fabrice, Soppera, Olivier, Zan, Hsiao-Wen, Li, Chang-Hung, Wieder, Fernand, Ponche, Arnaud, Berling, Dominique, Yeh, Bo-Hung, Wang, Kuan-Hsun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4444848/
https://www.ncbi.nlm.nih.gov/pubmed/26014902
http://dx.doi.org/10.1038/srep10490
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author Lin, Hung-Cheng
Stehlin, Fabrice
Soppera, Olivier
Zan, Hsiao-Wen
Li, Chang-Hung
Wieder, Fernand
Ponche, Arnaud
Berling, Dominique
Yeh, Bo-Hung
Wang, Kuan-Hsun
author_facet Lin, Hung-Cheng
Stehlin, Fabrice
Soppera, Olivier
Zan, Hsiao-Wen
Li, Chang-Hung
Wieder, Fernand
Ponche, Arnaud
Berling, Dominique
Yeh, Bo-Hung
Wang, Kuan-Hsun
author_sort Lin, Hung-Cheng
collection PubMed
description Deep-UV (DUV) laser was used to directly write indium-gallium-zinc-oxide (IGZO) precursor solution and form micro and nanoscale patterns. The directional DUV laser beam avoids the substrate heating and suppresses the diffraction effect. A IGZO precursor solution was also developed to fulfill the requirements for direct photopatterning and for achieving semi-conducting properties with thermal annealing at moderate temperature. The DUV-induced crosslinking of the starting material allows direct write of semi-conducting channels in thin-film transistors but also it improves the field-effect mobility and surface roughness. Material analysis has been carried out by XPS, FTIR, spectroscopic ellipsometry and AFM and the effect of DUV on the final material structure is discussed. The DUV irradiation step results in photolysis and a partial condensation of the inorganic network that freezes the sol-gel layer in a homogeneous distribution, lowering possibilities of thermally induced reorganization at the atomic scale. Laser irradiation allows high-resolution photopatterning and high-enough field-effect mobility, which enables the easy fabrication of oxide nanowires for applications in solar cell, display, flexible electronics, and biomedical sensors.
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spelling pubmed-44448482015-06-01 Deep ultraviolet laser direct write for patterning sol-gel InGaZnO semiconducting micro/nanowires and improving field-effect mobility Lin, Hung-Cheng Stehlin, Fabrice Soppera, Olivier Zan, Hsiao-Wen Li, Chang-Hung Wieder, Fernand Ponche, Arnaud Berling, Dominique Yeh, Bo-Hung Wang, Kuan-Hsun Sci Rep Article Deep-UV (DUV) laser was used to directly write indium-gallium-zinc-oxide (IGZO) precursor solution and form micro and nanoscale patterns. The directional DUV laser beam avoids the substrate heating and suppresses the diffraction effect. A IGZO precursor solution was also developed to fulfill the requirements for direct photopatterning and for achieving semi-conducting properties with thermal annealing at moderate temperature. The DUV-induced crosslinking of the starting material allows direct write of semi-conducting channels in thin-film transistors but also it improves the field-effect mobility and surface roughness. Material analysis has been carried out by XPS, FTIR, spectroscopic ellipsometry and AFM and the effect of DUV on the final material structure is discussed. The DUV irradiation step results in photolysis and a partial condensation of the inorganic network that freezes the sol-gel layer in a homogeneous distribution, lowering possibilities of thermally induced reorganization at the atomic scale. Laser irradiation allows high-resolution photopatterning and high-enough field-effect mobility, which enables the easy fabrication of oxide nanowires for applications in solar cell, display, flexible electronics, and biomedical sensors. Nature Publishing Group 2015-05-27 /pmc/articles/PMC4444848/ /pubmed/26014902 http://dx.doi.org/10.1038/srep10490 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Lin, Hung-Cheng
Stehlin, Fabrice
Soppera, Olivier
Zan, Hsiao-Wen
Li, Chang-Hung
Wieder, Fernand
Ponche, Arnaud
Berling, Dominique
Yeh, Bo-Hung
Wang, Kuan-Hsun
Deep ultraviolet laser direct write for patterning sol-gel InGaZnO semiconducting micro/nanowires and improving field-effect mobility
title Deep ultraviolet laser direct write for patterning sol-gel InGaZnO semiconducting micro/nanowires and improving field-effect mobility
title_full Deep ultraviolet laser direct write for patterning sol-gel InGaZnO semiconducting micro/nanowires and improving field-effect mobility
title_fullStr Deep ultraviolet laser direct write for patterning sol-gel InGaZnO semiconducting micro/nanowires and improving field-effect mobility
title_full_unstemmed Deep ultraviolet laser direct write for patterning sol-gel InGaZnO semiconducting micro/nanowires and improving field-effect mobility
title_short Deep ultraviolet laser direct write for patterning sol-gel InGaZnO semiconducting micro/nanowires and improving field-effect mobility
title_sort deep ultraviolet laser direct write for patterning sol-gel ingazno semiconducting micro/nanowires and improving field-effect mobility
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4444848/
https://www.ncbi.nlm.nih.gov/pubmed/26014902
http://dx.doi.org/10.1038/srep10490
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