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Structures, stabilities, and electronic properties of defects in monolayer black phosphorus

The structures, stabilities, and electronic properties of monolayer black phosphorus (M-BP) with different kinds of defects are investigated within the frame of density-functional theory. All the possible configurations of defects in M-BP are explored, and the calculated results suggest that the sta...

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Autores principales: Li, Xi-Bo, Guo, Pan, Cao, Teng-Fei, Liu, Hao, Lau, Woon-Ming, Liu, Li-Min
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4451700/
https://www.ncbi.nlm.nih.gov/pubmed/26035770
http://dx.doi.org/10.1038/srep10848
_version_ 1782374180255170560
author Li, Xi-Bo
Guo, Pan
Cao, Teng-Fei
Liu, Hao
Lau, Woon-Ming
Liu, Li-Min
author_facet Li, Xi-Bo
Guo, Pan
Cao, Teng-Fei
Liu, Hao
Lau, Woon-Ming
Liu, Li-Min
author_sort Li, Xi-Bo
collection PubMed
description The structures, stabilities, and electronic properties of monolayer black phosphorus (M-BP) with different kinds of defects are investigated within the frame of density-functional theory. All the possible configurations of defects in M-BP are explored, and the calculated results suggest that the stabilities of the configurations with different kinds of defects are greatly related to broken bonds, structural deformation and the character of the bonding. The configurations with two or three vacancies are energetically more favorable than the ones with a single vacancy. Meanwhile, the doping of two foreign atoms, such as sulfur, silicon or aluminum, is more stable than that of the corresponding single dopant. The electronic properties of M-BP are greatly affected by the types of defects. The single S-doped M-BP not only retains the character of a direct semiconductor, but it also can enlarge the band gap by 0.24 eV relative to the perfect one. Such results reveal that the defects not only greatly affect the electronic properties, but they also can be used as an effective way to modulate the band gap for the different applications of M-BP in electronic devices.
format Online
Article
Text
id pubmed-4451700
institution National Center for Biotechnology Information
language English
publishDate 2015
publisher Nature Publishing Group
record_format MEDLINE/PubMed
spelling pubmed-44517002015-06-09 Structures, stabilities, and electronic properties of defects in monolayer black phosphorus Li, Xi-Bo Guo, Pan Cao, Teng-Fei Liu, Hao Lau, Woon-Ming Liu, Li-Min Sci Rep Article The structures, stabilities, and electronic properties of monolayer black phosphorus (M-BP) with different kinds of defects are investigated within the frame of density-functional theory. All the possible configurations of defects in M-BP are explored, and the calculated results suggest that the stabilities of the configurations with different kinds of defects are greatly related to broken bonds, structural deformation and the character of the bonding. The configurations with two or three vacancies are energetically more favorable than the ones with a single vacancy. Meanwhile, the doping of two foreign atoms, such as sulfur, silicon or aluminum, is more stable than that of the corresponding single dopant. The electronic properties of M-BP are greatly affected by the types of defects. The single S-doped M-BP not only retains the character of a direct semiconductor, but it also can enlarge the band gap by 0.24 eV relative to the perfect one. Such results reveal that the defects not only greatly affect the electronic properties, but they also can be used as an effective way to modulate the band gap for the different applications of M-BP in electronic devices. Nature Publishing Group 2015-06-02 /pmc/articles/PMC4451700/ /pubmed/26035770 http://dx.doi.org/10.1038/srep10848 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Li, Xi-Bo
Guo, Pan
Cao, Teng-Fei
Liu, Hao
Lau, Woon-Ming
Liu, Li-Min
Structures, stabilities, and electronic properties of defects in monolayer black phosphorus
title Structures, stabilities, and electronic properties of defects in monolayer black phosphorus
title_full Structures, stabilities, and electronic properties of defects in monolayer black phosphorus
title_fullStr Structures, stabilities, and electronic properties of defects in monolayer black phosphorus
title_full_unstemmed Structures, stabilities, and electronic properties of defects in monolayer black phosphorus
title_short Structures, stabilities, and electronic properties of defects in monolayer black phosphorus
title_sort structures, stabilities, and electronic properties of defects in monolayer black phosphorus
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4451700/
https://www.ncbi.nlm.nih.gov/pubmed/26035770
http://dx.doi.org/10.1038/srep10848
work_keys_str_mv AT lixibo structuresstabilitiesandelectronicpropertiesofdefectsinmonolayerblackphosphorus
AT guopan structuresstabilitiesandelectronicpropertiesofdefectsinmonolayerblackphosphorus
AT caotengfei structuresstabilitiesandelectronicpropertiesofdefectsinmonolayerblackphosphorus
AT liuhao structuresstabilitiesandelectronicpropertiesofdefectsinmonolayerblackphosphorus
AT lauwoonming structuresstabilitiesandelectronicpropertiesofdefectsinmonolayerblackphosphorus
AT liulimin structuresstabilitiesandelectronicpropertiesofdefectsinmonolayerblackphosphorus