Structural investigations of the α(12) Si–Ge superstructure

This article reports the X-ray diffraction-based structural characterization of the α(12) multilayer structure SiGe(2)Si(2)Ge(2)SiGe(12) [d’Avezac, Luo, Chanier & Zunger (2012 ▶). Phys. Rev. Lett. 108, 027401], which is predicted to form a direct bandgap material. In particular, structural param...

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Detalles Bibliográficos
Autores principales: Etzelstorfer, Tanja, Ahmadpor Monazam, Mohammad Reza, Cecchi, Stefano, Kriegner, Dominik, Chrastina, Daniel, Gatti, Eleonora, Grilli, Emanuele, Rosemann, Nils, Chatterjee, Sangam, Holý, Vaclav, Pezzoli, Fabio, Isella, Giovanni, Stangl, Julian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4453172/
https://www.ncbi.nlm.nih.gov/pubmed/26089750
http://dx.doi.org/10.1107/S1600576715000849

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