XTOP: high-resolution X-ray diffraction and imaging

The latest virtual special issue of Journal of Applied Crystallography includes some highlights of the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), which took place in Villard-de-Lans and Grenoble in September 2014.

Detalles Bibliográficos
Autores principales: Favre-Nicolin, Vincent, Baruchel, José, Renevier, Hubert, Eymery, Joël, Borbély, András
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Editorial
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4453967/
https://www.ncbi.nlm.nih.gov/pubmed/26089754
http://dx.doi.org/10.1107/S160057671500895X
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author Favre-Nicolin, Vincent
Baruchel, José
Renevier, Hubert
Eymery, Joël
Borbély, András
author_facet Favre-Nicolin, Vincent
Baruchel, José
Renevier, Hubert
Eymery, Joël
Borbély, András
author_sort Favre-Nicolin, Vincent
collection PubMed
description The latest virtual special issue of Journal of Applied Crystallography includes some highlights of the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), which took place in Villard-de-Lans and Grenoble in September 2014.
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spelling pubmed-44539672015-06-18 XTOP: high-resolution X-ray diffraction and imaging Favre-Nicolin, Vincent Baruchel, José Renevier, Hubert Eymery, Joël Borbély, András J Appl Crystallogr Editorial The latest virtual special issue of Journal of Applied Crystallography includes some highlights of the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), which took place in Villard-de-Lans and Grenoble in September 2014. International Union of Crystallography 2015-05-31 /pmc/articles/PMC4453967/ /pubmed/26089754 http://dx.doi.org/10.1107/S160057671500895X Text en © Favre-Nicolin et al. 2015 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Editorial
Favre-Nicolin, Vincent
Baruchel, José
Renevier, Hubert
Eymery, Joël
Borbély, András
XTOP: high-resolution X-ray diffraction and imaging
title XTOP: high-resolution X-ray diffraction and imaging
title_full XTOP: high-resolution X-ray diffraction and imaging
title_fullStr XTOP: high-resolution X-ray diffraction and imaging
title_full_unstemmed XTOP: high-resolution X-ray diffraction and imaging
title_short XTOP: high-resolution X-ray diffraction and imaging
title_sort xtop: high-resolution x-ray diffraction and imaging
topic Editorial
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4453967/
https://www.ncbi.nlm.nih.gov/pubmed/26089754
http://dx.doi.org/10.1107/S160057671500895X
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AT renevierhubert xtophighresolutionxraydiffractionandimaging
AT eymeryjoel xtophighresolutionxraydiffractionandimaging
AT borbelyandras xtophighresolutionxraydiffractionandimaging

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