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XTOP: high-resolution X-ray diffraction and imaging

The latest virtual special issue of Journal of Applied Crystallography includes some highlights of the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), which took place in Villard-de-Lans and Grenoble in September 2014.

Detalles Bibliográficos
Autores principales:	Favre-Nicolin, Vincent, Baruchel, José, Renevier, Hubert, Eymery, Joël, Borbély, András
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2015
Materias:	Editorial
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4453967/ https://www.ncbi.nlm.nih.gov/pubmed/26089754 http://dx.doi.org/10.1107/S160057671500895X

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