Cargando…
Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging
Rocking curve imaging (projection and section X-ray topography) has been used to study the generation and propagation of defects at the junctions between and above the seed crystals in mono-like silicon ingots. The images of different kinds of defects such as precipitates, dislocations and twins in...
| Autores principales: | , , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2015
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4453969/ https://www.ncbi.nlm.nih.gov/pubmed/26089756 http://dx.doi.org/10.1107/S1600576715004926 |