Ab initio simulation of diffractometer instrumental function for high-resolution X-ray diffraction

Modeling of the X-ray diffractometer instrumental function for a given optics configuration is important both for planning experiments and for the analysis of measured data. A fast and universal method for instrumental function simulation, suitable for fully automated computer realization and descri...

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Detalles Bibliográficos
Autores principales: Mikhalychev, Alexander, Benediktovitch, Andrei, Ulyanenkova, Tatjana, Ulyanenkov, Alex
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4453973/
https://www.ncbi.nlm.nih.gov/pubmed/26089760
http://dx.doi.org/10.1107/S1600576715006986

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4453973/
https://www.ncbi.nlm.nih.gov/pubmed/26089760
http://dx.doi.org/10.1107/S1600576715006986

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