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Ab initio simulation of diffractometer instrumental function for high-resolution X-ray diffraction
Modeling of the X-ray diffractometer instrumental function for a given optics configuration is important both for planning experiments and for the analysis of measured data. A fast and universal method for instrumental function simulation, suitable for fully automated computer realization and descri...
Autores principales: | Mikhalychev, Alexander, Benediktovitch, Andrei, Ulyanenkova, Tatjana, Ulyanenkov, Alex |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4453973/ https://www.ncbi.nlm.nih.gov/pubmed/26089760 http://dx.doi.org/10.1107/S1600576715006986 |
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