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Tailoring resistive switching in Pt/SrTiO(3) junctions by stoichiometry control

Resistive switching effects in transition metal oxide-based devices offer new opportunities for information storage and computing technologies. Although it is known that resistive switching is a defect-driven phenomenon, the precise mechanisms are still poorly understood owing to the difficulty of s...

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Detalles Bibliográficos
Autores principales: Mikheev, Evgeny, Hwang, Jinwoo, Kajdos, Adam P., Hauser, Adam J., Stemmer, Susanne
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4460896/
https://www.ncbi.nlm.nih.gov/pubmed/26056783
http://dx.doi.org/10.1038/srep11079

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