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Traction microscopy to identify force modulation in sub-resolution adhesions

We present a reconstruction algorithm that resolves cellular tractions in diffraction-limited nascent adhesions (NAs). The enabling method is the introduction of sparsity regularization to the solution of the inverse problem, which suppresses noise without underestimating traction magnitude. We show...

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Detalles Bibliográficos
Autores principales: Han, Sangyoon J., Oak, Youbean, Groisman, Alex, Danuser, Gaudenz
Formato: Online Artículo Texto
Lenguaje:English
Publicado: 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4490115/
https://www.ncbi.nlm.nih.gov/pubmed/26030446
http://dx.doi.org/10.1038/nmeth.3430
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author Han, Sangyoon J.
Oak, Youbean
Groisman, Alex
Danuser, Gaudenz
author_facet Han, Sangyoon J.
Oak, Youbean
Groisman, Alex
Danuser, Gaudenz
author_sort Han, Sangyoon J.
collection PubMed
description We present a reconstruction algorithm that resolves cellular tractions in diffraction-limited nascent adhesions (NAs). The enabling method is the introduction of sparsity regularization to the solution of the inverse problem, which suppresses noise without underestimating traction magnitude. We show that NAs transmit a distinguishable amount of traction and that NA maturation depends on traction growth rate. A software package implementing this numerical approach is provided.
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spelling pubmed-44901152016-01-01 Traction microscopy to identify force modulation in sub-resolution adhesions Han, Sangyoon J. Oak, Youbean Groisman, Alex Danuser, Gaudenz Nat Methods Article We present a reconstruction algorithm that resolves cellular tractions in diffraction-limited nascent adhesions (NAs). The enabling method is the introduction of sparsity regularization to the solution of the inverse problem, which suppresses noise without underestimating traction magnitude. We show that NAs transmit a distinguishable amount of traction and that NA maturation depends on traction growth rate. A software package implementing this numerical approach is provided. 2015-06-01 2015-07 /pmc/articles/PMC4490115/ /pubmed/26030446 http://dx.doi.org/10.1038/nmeth.3430 Text en http://www.nature.com/authors/editorial_policies/license.html#terms Users may view, print, copy, and download text and data-mine the content in such documents, for the purposes of academic research, subject always to the full Conditions of use:http://www.nature.com/authors/editorial_policies/license.html#terms
spellingShingle Article
Han, Sangyoon J.
Oak, Youbean
Groisman, Alex
Danuser, Gaudenz
Traction microscopy to identify force modulation in sub-resolution adhesions
title Traction microscopy to identify force modulation in sub-resolution adhesions
title_full Traction microscopy to identify force modulation in sub-resolution adhesions
title_fullStr Traction microscopy to identify force modulation in sub-resolution adhesions
title_full_unstemmed Traction microscopy to identify force modulation in sub-resolution adhesions
title_short Traction microscopy to identify force modulation in sub-resolution adhesions
title_sort traction microscopy to identify force modulation in sub-resolution adhesions
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4490115/
https://www.ncbi.nlm.nih.gov/pubmed/26030446
http://dx.doi.org/10.1038/nmeth.3430
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AT danusergaudenz tractionmicroscopytoidentifyforcemodulationinsubresolutionadhesions