Nearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin films

Piezoresistive responses of nanoparticle thin-film strain sensors on flexible polyimide substrates were studied. Disordered interparticle tunneling introduces microscopic detour of charge conduction so as to reduce gauge factors. The disorder also results in large resistance change when current flow...

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Autores principales: Jiang, Cheng-Wei, Ni, I.-Chih, Tzeng, Shien-Der, Kuo, Watson
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4502517/
https://www.ncbi.nlm.nih.gov/pubmed/26173736
http://dx.doi.org/10.1038/srep11939
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author Jiang, Cheng-Wei
Ni, I.-Chih
Tzeng, Shien-Der
Kuo, Watson
author_facet Jiang, Cheng-Wei
Ni, I.-Chih
Tzeng, Shien-Der
Kuo, Watson
author_sort Jiang, Cheng-Wei
collection PubMed
description Piezoresistive responses of nanoparticle thin-film strain sensors on flexible polyimide substrates were studied. Disordered interparticle tunneling introduces microscopic detour of charge conduction so as to reduce gauge factors. The disorder also results in large resistance change when current flows in the direction perpendicular to a unidirectional strain, reducing response anisotropy. For practical usages, stability and endurance of these strain sensors are confirmed with 7 × 10(4) bending cycles. Cracks form in devices under prolonged cyclic bending and slightly reduce gauge factor.
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spelling pubmed-45025172015-07-17 Nearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin films Jiang, Cheng-Wei Ni, I.-Chih Tzeng, Shien-Der Kuo, Watson Sci Rep Article Piezoresistive responses of nanoparticle thin-film strain sensors on flexible polyimide substrates were studied. Disordered interparticle tunneling introduces microscopic detour of charge conduction so as to reduce gauge factors. The disorder also results in large resistance change when current flows in the direction perpendicular to a unidirectional strain, reducing response anisotropy. For practical usages, stability and endurance of these strain sensors are confirmed with 7 × 10(4) bending cycles. Cracks form in devices under prolonged cyclic bending and slightly reduce gauge factor. Nature Publishing Group 2015-07-15 /pmc/articles/PMC4502517/ /pubmed/26173736 http://dx.doi.org/10.1038/srep11939 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Jiang, Cheng-Wei
Ni, I.-Chih
Tzeng, Shien-Der
Kuo, Watson
Nearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin films
title Nearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin films
title_full Nearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin films
title_fullStr Nearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin films
title_full_unstemmed Nearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin films
title_short Nearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin films
title_sort nearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin films
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4502517/
https://www.ncbi.nlm.nih.gov/pubmed/26173736
http://dx.doi.org/10.1038/srep11939
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