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Studying the Polarization Switching in Polycrystalline BiFeO(3) Films by 2D Piezoresponse Force Microscopy
For rhombohedral multiferroelectrics, non-180° ferroelectric domain switching may induce ferroelastic and/or (anti-)ferromagnetic effect. So the determination and control of ferroelectric domain switching angles is crucial for nonvolatile information storage and exchange-coupled magnetoelectric devi...
Autores principales: | , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4507449/ https://www.ncbi.nlm.nih.gov/pubmed/26192555 http://dx.doi.org/10.1038/srep12237 |
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author | Jin, Yaming Lu, Xiaomei Zhang, Junting Kan, Yi Bo, Huifeng Huang, Fengzhen Xu, Tingting Du, Yingchao Xiao, Shuyu Zhu, Jinsong |
author_facet | Jin, Yaming Lu, Xiaomei Zhang, Junting Kan, Yi Bo, Huifeng Huang, Fengzhen Xu, Tingting Du, Yingchao Xiao, Shuyu Zhu, Jinsong |
author_sort | Jin, Yaming |
collection | PubMed |
description | For rhombohedral multiferroelectrics, non-180° ferroelectric domain switching may induce ferroelastic and/or (anti-)ferromagnetic effect. So the determination and control of ferroelectric domain switching angles is crucial for nonvolatile information storage and exchange-coupled magnetoelectric devices. We try to study the intrinsic characters of polarization switching in BiFeO(3) by introducing a special data processing method to determine the switching angle from 2D PFM (Piezoresponse Force Microscopy) images of randomly oriented samples. The response surface of BiFeO(3) is first plotted using the piezoelectric tensor got from first principles calculations. Then from the normalized 2D PFM signals before and after switching, the switching angles of randomly oriented BiFeO(3) grains can be determined through numerical calculations. In the polycrystalline BiFeO(3) films, up to 34% of all switched area is that with original out-of-plane (OP) polarization parallel to the poling field. 71° polarization switching is more favorable, with the area percentages of 71°, 109° and 180° domain switching being about 42%, 29% and 29%, respectively. Our analysis further reveals that IP stress and charge migration have comparable effect on switching, and they are sensitive to the geometric arrangements. This work helps exploring a route to control polarization switching in BiFeO(3), so as to realize desirable magnetoelectric coupling. |
format | Online Article Text |
id | pubmed-4507449 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2015 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-45074492015-07-21 Studying the Polarization Switching in Polycrystalline BiFeO(3) Films by 2D Piezoresponse Force Microscopy Jin, Yaming Lu, Xiaomei Zhang, Junting Kan, Yi Bo, Huifeng Huang, Fengzhen Xu, Tingting Du, Yingchao Xiao, Shuyu Zhu, Jinsong Sci Rep Article For rhombohedral multiferroelectrics, non-180° ferroelectric domain switching may induce ferroelastic and/or (anti-)ferromagnetic effect. So the determination and control of ferroelectric domain switching angles is crucial for nonvolatile information storage and exchange-coupled magnetoelectric devices. We try to study the intrinsic characters of polarization switching in BiFeO(3) by introducing a special data processing method to determine the switching angle from 2D PFM (Piezoresponse Force Microscopy) images of randomly oriented samples. The response surface of BiFeO(3) is first plotted using the piezoelectric tensor got from first principles calculations. Then from the normalized 2D PFM signals before and after switching, the switching angles of randomly oriented BiFeO(3) grains can be determined through numerical calculations. In the polycrystalline BiFeO(3) films, up to 34% of all switched area is that with original out-of-plane (OP) polarization parallel to the poling field. 71° polarization switching is more favorable, with the area percentages of 71°, 109° and 180° domain switching being about 42%, 29% and 29%, respectively. Our analysis further reveals that IP stress and charge migration have comparable effect on switching, and they are sensitive to the geometric arrangements. This work helps exploring a route to control polarization switching in BiFeO(3), so as to realize desirable magnetoelectric coupling. Nature Publishing Group 2015-07-20 /pmc/articles/PMC4507449/ /pubmed/26192555 http://dx.doi.org/10.1038/srep12237 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Article Jin, Yaming Lu, Xiaomei Zhang, Junting Kan, Yi Bo, Huifeng Huang, Fengzhen Xu, Tingting Du, Yingchao Xiao, Shuyu Zhu, Jinsong Studying the Polarization Switching in Polycrystalline BiFeO(3) Films by 2D Piezoresponse Force Microscopy |
title | Studying the Polarization Switching in Polycrystalline BiFeO(3) Films by 2D Piezoresponse Force Microscopy |
title_full | Studying the Polarization Switching in Polycrystalline BiFeO(3) Films by 2D Piezoresponse Force Microscopy |
title_fullStr | Studying the Polarization Switching in Polycrystalline BiFeO(3) Films by 2D Piezoresponse Force Microscopy |
title_full_unstemmed | Studying the Polarization Switching in Polycrystalline BiFeO(3) Films by 2D Piezoresponse Force Microscopy |
title_short | Studying the Polarization Switching in Polycrystalline BiFeO(3) Films by 2D Piezoresponse Force Microscopy |
title_sort | studying the polarization switching in polycrystalline bifeo(3) films by 2d piezoresponse force microscopy |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4507449/ https://www.ncbi.nlm.nih.gov/pubmed/26192555 http://dx.doi.org/10.1038/srep12237 |
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