Nanoleakage of Class V Resin Restorations Using Two Nanofilled Adhesive Systems

BACKGROUND: This study was carried out to evaluate the nanoleakage of two types of nanofilled adhesive systems in Class V composite resin restorations. MATERIALS AND METHODS: Totally 60 human premolars were randomly assigned to two groups (n = 30). Standardized round Class V cavities (enamel and dentin margins) were prepared. A total-etch (N-Bond total etch) (Ivoclar Vivadent) and self-etching (N-Bond self-etch) (Ivoclar Vivadent) adhesive system were evaluated. The cavities were restored incrementally with nanohybird composite resin (Tetric N-Ceram). The teeth were sectioned into a series of 1 mm thick beams then they were immersed in the prepared ammoniacal silver nitrate tracer solution for 24 h in a black photo-film container to ensure total darkness. The beams were then rinsed with distilled water, and immersed in photo-developing solution for eight hours then they were subjected to the nanoleakage evaluation. The specimens were analyzed in the environmental scanning electron operated with backscattered electron mode at ×1000 magnification. RESULTS: Self-etch adhesive recorded higher nanoleakage % mean value than the total-etch adhesive. The difference in nanoleakage % mean values between total and self-etch adhesive was statistically significant. CONCLUSION: The self-etch adhesive had statistically significant higher nanoleakage mean values than the total-etch adhesive.