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Time delay measurement in the frequency domain
Pump–probe studies at synchrotrons using X-ray and laser pulses require accurate determination of the time delay between pulses. This becomes especially important when observing ultrafast responses with lifetimes approaching or even less than the X-ray pulse duration (∼100 ps). The standard approach...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4542455/ https://www.ncbi.nlm.nih.gov/pubmed/26289282 http://dx.doi.org/10.1107/S1600577515014095 |
Sumario: | Pump–probe studies at synchrotrons using X-ray and laser pulses require accurate determination of the time delay between pulses. This becomes especially important when observing ultrafast responses with lifetimes approaching or even less than the X-ray pulse duration (∼100 ps). The standard approach of inspecting the time response of a detector sensitive to both types of pulses can have limitations due to dissimilar pulse profiles and other experimental factors. Here, a simple alternative is presented, where the frequency response of the detector is monitored versus time delay. Measurements readily demonstrate a time resolution of ∼1 ps. Improved precision is possible by simply extending the data acquisition time. |
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