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A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium
We compare methods for estimating the residual resistivity ratio (RRR) of high-purity niobium and investigate the effects of using different functional models. RRR is typically defined as the ratio of the electrical resistances measured at 273 K (the ice point) and 4.2 K (the boiling point of helium...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2011
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4551274/ https://www.ncbi.nlm.nih.gov/pubmed/26989580 http://dx.doi.org/10.6028/jres.116.001 |
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author | Splett, J. D. Vecchia, D. F. Goodrich, L. F. |
author_facet | Splett, J. D. Vecchia, D. F. Goodrich, L. F. |
author_sort | Splett, J. D. |
collection | PubMed |
description | We compare methods for estimating the residual resistivity ratio (RRR) of high-purity niobium and investigate the effects of using different functional models. RRR is typically defined as the ratio of the electrical resistances measured at 273 K (the ice point) and 4.2 K (the boiling point of helium at standard atmospheric pressure). However, pure niobium is superconducting below about 9.3 K, so the low-temperature resistance is defined as the normal-state (i.e., non-superconducting state) resistance extrapolated to 4.2 K and zero magnetic field. Thus, the estimated value of RRR depends significantly on the model used for extrapolation. We examine three models for extrapolation based on temperature versus resistance, two models for extrapolation based on magnetic field versus resistance, and a new model based on the Kohler relationship that can be applied to combined temperature and field data. We also investigate the possibility of re-defining RRR so that the quantity is not dependent on extrapolation. |
format | Online Article Text |
id | pubmed-4551274 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2011 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-45512742016-03-17 A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium Splett, J. D. Vecchia, D. F. Goodrich, L. F. J Res Natl Inst Stand Technol Article We compare methods for estimating the residual resistivity ratio (RRR) of high-purity niobium and investigate the effects of using different functional models. RRR is typically defined as the ratio of the electrical resistances measured at 273 K (the ice point) and 4.2 K (the boiling point of helium at standard atmospheric pressure). However, pure niobium is superconducting below about 9.3 K, so the low-temperature resistance is defined as the normal-state (i.e., non-superconducting state) resistance extrapolated to 4.2 K and zero magnetic field. Thus, the estimated value of RRR depends significantly on the model used for extrapolation. We examine three models for extrapolation based on temperature versus resistance, two models for extrapolation based on magnetic field versus resistance, and a new model based on the Kohler relationship that can be applied to combined temperature and field data. We also investigate the possibility of re-defining RRR so that the quantity is not dependent on extrapolation. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2011 2011-02-01 /pmc/articles/PMC4551274/ /pubmed/26989580 http://dx.doi.org/10.6028/jres.116.001 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Splett, J. D. Vecchia, D. F. Goodrich, L. F. A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium |
title | A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium |
title_full | A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium |
title_fullStr | A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium |
title_full_unstemmed | A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium |
title_short | A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium |
title_sort | comparison of methods for computing the residual resistivity ratio of high-purity niobium |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4551274/ https://www.ncbi.nlm.nih.gov/pubmed/26989580 http://dx.doi.org/10.6028/jres.116.001 |
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