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Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector

A commercial spectrometer with an integrating sphere (IS) detector was used to measure the scattering cross section of microspheres. Analysis of the measurement process showed that two measurements of the absorbance, one with the cuvette placed in the normal spectrometer position, and the second wit...

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Autores principales: Gaigalas, A. K., Wang, Lili, Karpiak, V., Zhang, Yu-Zhong, Choquette, Steven
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2012
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4553878/
https://www.ncbi.nlm.nih.gov/pubmed/26900524
http://dx.doi.org/10.6028/jres.117.012
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author Gaigalas, A. K.
Wang, Lili
Karpiak, V.
Zhang, Yu-Zhong
Choquette, Steven
author_facet Gaigalas, A. K.
Wang, Lili
Karpiak, V.
Zhang, Yu-Zhong
Choquette, Steven
author_sort Gaigalas, A. K.
collection PubMed
description A commercial spectrometer with an integrating sphere (IS) detector was used to measure the scattering cross section of microspheres. Analysis of the measurement process showed that two measurements of the absorbance, one with the cuvette placed in the normal spectrometer position, and the second with the cuvette placed inside the IS, provided enough information to separate the contributions from scattering and molecular absorption. Measurements were carried out with microspheres with different diameters. The data was fitted with a model consisting of the difference of two terms. The first term was the Lorenz-Mie (L-M) cross section which modeled the total absorbance due to scattering. The second term was the integral of the L-M differential cross section over the detector acceptance angle. The second term estimated the amount of forward scattered light that entered the detector. A wavelength dependent index of refraction was used in the model. The agreement between the model and the data was good between 300 nm and 800 nm. The fits provided values for the microsphere diameter, the concentration, and the wavelength dependent index of refraction. For wavelengths less than 300 nm, the scattering cross section had significant spectral structure which was inversely related to the molecular absorption. This work addresses the measurement and interpretation of the scattering cross section for wavelengths between 300 nm and 800 nm.
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spelling pubmed-45538782016-02-19 Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector Gaigalas, A. K. Wang, Lili Karpiak, V. Zhang, Yu-Zhong Choquette, Steven J Res Natl Inst Stand Technol Article A commercial spectrometer with an integrating sphere (IS) detector was used to measure the scattering cross section of microspheres. Analysis of the measurement process showed that two measurements of the absorbance, one with the cuvette placed in the normal spectrometer position, and the second with the cuvette placed inside the IS, provided enough information to separate the contributions from scattering and molecular absorption. Measurements were carried out with microspheres with different diameters. The data was fitted with a model consisting of the difference of two terms. The first term was the Lorenz-Mie (L-M) cross section which modeled the total absorbance due to scattering. The second term was the integral of the L-M differential cross section over the detector acceptance angle. The second term estimated the amount of forward scattered light that entered the detector. A wavelength dependent index of refraction was used in the model. The agreement between the model and the data was good between 300 nm and 800 nm. The fits provided values for the microsphere diameter, the concentration, and the wavelength dependent index of refraction. For wavelengths less than 300 nm, the scattering cross section had significant spectral structure which was inversely related to the molecular absorption. This work addresses the measurement and interpretation of the scattering cross section for wavelengths between 300 nm and 800 nm. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2012-09-13 /pmc/articles/PMC4553878/ /pubmed/26900524 http://dx.doi.org/10.6028/jres.117.012 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Gaigalas, A. K.
Wang, Lili
Karpiak, V.
Zhang, Yu-Zhong
Choquette, Steven
Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
title Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
title_full Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
title_fullStr Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
title_full_unstemmed Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
title_short Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
title_sort measurement of scattering cross section with a spectrophotometer with an integrating sphere detector
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4553878/
https://www.ncbi.nlm.nih.gov/pubmed/26900524
http://dx.doi.org/10.6028/jres.117.012
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