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Investigation of diffusion length distribution on polycrystalline silicon wafers via photoluminescence methods
Characterization of the diffusion length of solar cells in space has been widely studied using various methods, but few studies have focused on a fast, simple way to obtain the quantified diffusion length distribution on a silicon wafer. In this work, we present two different facile methods of doing...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4572748/ https://www.ncbi.nlm.nih.gov/pubmed/26364565 http://dx.doi.org/10.1038/srep14084 |