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Mechanical Flip-Chip for Ultra-High Electron Mobility Devices
Electrostatic gates are of paramount importance for the physics of devices based on high-mobility two-dimensional electron gas (2DEG) since they allow depletion of electrons in selected areas. This field-effect gating enables the fabrication of a wide range of devices such as, for example, quantum p...
Autores principales: | , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4585730/ https://www.ncbi.nlm.nih.gov/pubmed/26391400 http://dx.doi.org/10.1038/srep13494 |
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author | Bennaceur, Keyan Schmidt, Benjamin A. Gaucher, Samuel Laroche, Dominique Lilly, Michael P. Reno, John L. West, Ken W. Pfeiffer, Loren N. Gervais, Guillaume |
author_facet | Bennaceur, Keyan Schmidt, Benjamin A. Gaucher, Samuel Laroche, Dominique Lilly, Michael P. Reno, John L. West, Ken W. Pfeiffer, Loren N. Gervais, Guillaume |
author_sort | Bennaceur, Keyan |
collection | PubMed |
description | Electrostatic gates are of paramount importance for the physics of devices based on high-mobility two-dimensional electron gas (2DEG) since they allow depletion of electrons in selected areas. This field-effect gating enables the fabrication of a wide range of devices such as, for example, quantum point contacts (QPC), electron interferometers and quantum dots. To fabricate these gates, processing is usually performed on the 2DEG material, which is in many cases detrimental to its electron mobility. Here we propose an alternative process which does not require any processing of the 2DEG material other than for the ohmic contacts. This approach relies on processing a separate wafer that is then mechanically mounted on the 2DEG material in a flip-chip fashion. This technique proved successful to fabricate quantum point contacts on both GaAs/AlGaAs materials with both moderate and ultra-high electron mobility. |
format | Online Article Text |
id | pubmed-4585730 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2015 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-45857302015-09-29 Mechanical Flip-Chip for Ultra-High Electron Mobility Devices Bennaceur, Keyan Schmidt, Benjamin A. Gaucher, Samuel Laroche, Dominique Lilly, Michael P. Reno, John L. West, Ken W. Pfeiffer, Loren N. Gervais, Guillaume Sci Rep Article Electrostatic gates are of paramount importance for the physics of devices based on high-mobility two-dimensional electron gas (2DEG) since they allow depletion of electrons in selected areas. This field-effect gating enables the fabrication of a wide range of devices such as, for example, quantum point contacts (QPC), electron interferometers and quantum dots. To fabricate these gates, processing is usually performed on the 2DEG material, which is in many cases detrimental to its electron mobility. Here we propose an alternative process which does not require any processing of the 2DEG material other than for the ohmic contacts. This approach relies on processing a separate wafer that is then mechanically mounted on the 2DEG material in a flip-chip fashion. This technique proved successful to fabricate quantum point contacts on both GaAs/AlGaAs materials with both moderate and ultra-high electron mobility. Nature Publishing Group 2015-09-22 /pmc/articles/PMC4585730/ /pubmed/26391400 http://dx.doi.org/10.1038/srep13494 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Article Bennaceur, Keyan Schmidt, Benjamin A. Gaucher, Samuel Laroche, Dominique Lilly, Michael P. Reno, John L. West, Ken W. Pfeiffer, Loren N. Gervais, Guillaume Mechanical Flip-Chip for Ultra-High Electron Mobility Devices |
title | Mechanical Flip-Chip for Ultra-High Electron Mobility Devices |
title_full | Mechanical Flip-Chip for Ultra-High Electron Mobility Devices |
title_fullStr | Mechanical Flip-Chip for Ultra-High Electron Mobility Devices |
title_full_unstemmed | Mechanical Flip-Chip for Ultra-High Electron Mobility Devices |
title_short | Mechanical Flip-Chip for Ultra-High Electron Mobility Devices |
title_sort | mechanical flip-chip for ultra-high electron mobility devices |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4585730/ https://www.ncbi.nlm.nih.gov/pubmed/26391400 http://dx.doi.org/10.1038/srep13494 |
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