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Mechanical Flip-Chip for Ultra-High Electron Mobility Devices

Electrostatic gates are of paramount importance for the physics of devices based on high-mobility two-dimensional electron gas (2DEG) since they allow depletion of electrons in selected areas. This field-effect gating enables the fabrication of a wide range of devices such as, for example, quantum p...

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Autores principales: Bennaceur, Keyan, Schmidt, Benjamin A., Gaucher, Samuel, Laroche, Dominique, Lilly, Michael P., Reno, John L., West, Ken W., Pfeiffer, Loren N., Gervais, Guillaume
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4585730/
https://www.ncbi.nlm.nih.gov/pubmed/26391400
http://dx.doi.org/10.1038/srep13494
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author Bennaceur, Keyan
Schmidt, Benjamin A.
Gaucher, Samuel
Laroche, Dominique
Lilly, Michael P.
Reno, John L.
West, Ken W.
Pfeiffer, Loren N.
Gervais, Guillaume
author_facet Bennaceur, Keyan
Schmidt, Benjamin A.
Gaucher, Samuel
Laroche, Dominique
Lilly, Michael P.
Reno, John L.
West, Ken W.
Pfeiffer, Loren N.
Gervais, Guillaume
author_sort Bennaceur, Keyan
collection PubMed
description Electrostatic gates are of paramount importance for the physics of devices based on high-mobility two-dimensional electron gas (2DEG) since they allow depletion of electrons in selected areas. This field-effect gating enables the fabrication of a wide range of devices such as, for example, quantum point contacts (QPC), electron interferometers and quantum dots. To fabricate these gates, processing is usually performed on the 2DEG material, which is in many cases detrimental to its electron mobility. Here we propose an alternative process which does not require any processing of the 2DEG material other than for the ohmic contacts. This approach relies on processing a separate wafer that is then mechanically mounted on the 2DEG material in a flip-chip fashion. This technique proved successful to fabricate quantum point contacts on both GaAs/AlGaAs materials with both moderate and ultra-high electron mobility.
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spelling pubmed-45857302015-09-29 Mechanical Flip-Chip for Ultra-High Electron Mobility Devices Bennaceur, Keyan Schmidt, Benjamin A. Gaucher, Samuel Laroche, Dominique Lilly, Michael P. Reno, John L. West, Ken W. Pfeiffer, Loren N. Gervais, Guillaume Sci Rep Article Electrostatic gates are of paramount importance for the physics of devices based on high-mobility two-dimensional electron gas (2DEG) since they allow depletion of electrons in selected areas. This field-effect gating enables the fabrication of a wide range of devices such as, for example, quantum point contacts (QPC), electron interferometers and quantum dots. To fabricate these gates, processing is usually performed on the 2DEG material, which is in many cases detrimental to its electron mobility. Here we propose an alternative process which does not require any processing of the 2DEG material other than for the ohmic contacts. This approach relies on processing a separate wafer that is then mechanically mounted on the 2DEG material in a flip-chip fashion. This technique proved successful to fabricate quantum point contacts on both GaAs/AlGaAs materials with both moderate and ultra-high electron mobility. Nature Publishing Group 2015-09-22 /pmc/articles/PMC4585730/ /pubmed/26391400 http://dx.doi.org/10.1038/srep13494 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Bennaceur, Keyan
Schmidt, Benjamin A.
Gaucher, Samuel
Laroche, Dominique
Lilly, Michael P.
Reno, John L.
West, Ken W.
Pfeiffer, Loren N.
Gervais, Guillaume
Mechanical Flip-Chip for Ultra-High Electron Mobility Devices
title Mechanical Flip-Chip for Ultra-High Electron Mobility Devices
title_full Mechanical Flip-Chip for Ultra-High Electron Mobility Devices
title_fullStr Mechanical Flip-Chip for Ultra-High Electron Mobility Devices
title_full_unstemmed Mechanical Flip-Chip for Ultra-High Electron Mobility Devices
title_short Mechanical Flip-Chip for Ultra-High Electron Mobility Devices
title_sort mechanical flip-chip for ultra-high electron mobility devices
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4585730/
https://www.ncbi.nlm.nih.gov/pubmed/26391400
http://dx.doi.org/10.1038/srep13494
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