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The Effects of Grain Boundaries on the Current Transport Properties in YBCO-Coated Conductors

We report a detailed study of the grain orientations and grain boundary (GB) networks in Y(2)O(3) films grown on Ni-5 at.%W substrates. Electron back scatter diffraction (EBSD) exhibited different GB misorientation angle distributions, strongly decided by Y(2)O(3) films with different textures. The...

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Detalles Bibliográficos
Autores principales:	Yang, Chao, Xia, Yudong, Xue, Yan, Zhang, Fei, Tao, Bowan, Xiong, Jie
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer US 2015
Materias:	Nano Express
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4620109/ https://www.ncbi.nlm.nih.gov/pubmed/26497731 http://dx.doi.org/10.1186/s11671-015-1124-8

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