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Double Laser for Depth Measurement of Thin Films of Ice
The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4634385/ https://www.ncbi.nlm.nih.gov/pubmed/26426024 http://dx.doi.org/10.3390/s151025123 |
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author | Domingo Beltrán, Manuel Luna Molina, Ramón Satorre Aznar, Miguel Ángel Santonja Moltó, Carmina Millán Verdú, Carlos |
author_facet | Domingo Beltrán, Manuel Luna Molina, Ramón Satorre Aznar, Miguel Ángel Santonja Moltó, Carmina Millán Verdú, Carlos |
author_sort | Domingo Beltrán, Manuel |
collection | PubMed |
description | The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we can also measure the refractive index of the thin film material exactly under the same experimental conditions. We have also obtained interesting results with regard to structural changes in the solid substance with changing temperature and have observed the corresponding behavior of mixtures of substances. |
format | Online Article Text |
id | pubmed-4634385 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2015 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-46343852015-11-23 Double Laser for Depth Measurement of Thin Films of Ice Domingo Beltrán, Manuel Luna Molina, Ramón Satorre Aznar, Miguel Ángel Santonja Moltó, Carmina Millán Verdú, Carlos Sensors (Basel) Article The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we can also measure the refractive index of the thin film material exactly under the same experimental conditions. We have also obtained interesting results with regard to structural changes in the solid substance with changing temperature and have observed the corresponding behavior of mixtures of substances. MDPI 2015-09-29 /pmc/articles/PMC4634385/ /pubmed/26426024 http://dx.doi.org/10.3390/s151025123 Text en © 2015 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Domingo Beltrán, Manuel Luna Molina, Ramón Satorre Aznar, Miguel Ángel Santonja Moltó, Carmina Millán Verdú, Carlos Double Laser for Depth Measurement of Thin Films of Ice |
title | Double Laser for Depth Measurement of Thin Films of Ice |
title_full | Double Laser for Depth Measurement of Thin Films of Ice |
title_fullStr | Double Laser for Depth Measurement of Thin Films of Ice |
title_full_unstemmed | Double Laser for Depth Measurement of Thin Films of Ice |
title_short | Double Laser for Depth Measurement of Thin Films of Ice |
title_sort | double laser for depth measurement of thin films of ice |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4634385/ https://www.ncbi.nlm.nih.gov/pubmed/26426024 http://dx.doi.org/10.3390/s151025123 |
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