Double Laser for Depth Measurement of Thin Films of Ice

The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we...

Descripción completa

Detalles Bibliográficos
Autores principales: Domingo Beltrán, Manuel, Luna Molina, Ramón, Satorre Aznar, Miguel Ángel, Santonja Moltó, Carmina, Millán Verdú, Carlos
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4634385/
https://www.ncbi.nlm.nih.gov/pubmed/26426024
http://dx.doi.org/10.3390/s151025123

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4634385/
https://www.ncbi.nlm.nih.gov/pubmed/26426024
http://dx.doi.org/10.3390/s151025123

Ejemplares similares