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Double Laser for Depth Measurement of Thin Films of Ice
The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we...
Autores principales: | Domingo Beltrán, Manuel, Luna Molina, Ramón, Satorre Aznar, Miguel Ángel, Santonja Moltó, Carmina, Millán Verdú, Carlos |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4634385/ https://www.ncbi.nlm.nih.gov/pubmed/26426024 http://dx.doi.org/10.3390/s151025123 |
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