Optically detecting the edge-state of a three-dimensional topological insulator under ambient conditions by ultrafast infrared photoluminescence spectroscopy

Ultrafast infrared photoluminescence spectroscopy was applied to a three-dimensional topological insulator TlBiSe(2) under ambient conditions. The dynamics of the luminescence exhibited bulk-insulating and gapless characteristics bounded by the bulk band gap energy. The existence of the topologicall...

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Autores principales: Maezawa, Shun-ya, Watanabe, Hiroshi, Takeda, Masahiro, Kuroda, Kenta, Someya, Takashi, Matsuda, Iwao, Suemoto, Tohru
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4639728/
https://www.ncbi.nlm.nih.gov/pubmed/26552784
http://dx.doi.org/10.1038/srep16443
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author Maezawa, Shun-ya
Watanabe, Hiroshi
Takeda, Masahiro
Kuroda, Kenta
Someya, Takashi
Matsuda, Iwao
Suemoto, Tohru
author_facet Maezawa, Shun-ya
Watanabe, Hiroshi
Takeda, Masahiro
Kuroda, Kenta
Someya, Takashi
Matsuda, Iwao
Suemoto, Tohru
author_sort Maezawa, Shun-ya
collection PubMed
description Ultrafast infrared photoluminescence spectroscopy was applied to a three-dimensional topological insulator TlBiSe(2) under ambient conditions. The dynamics of the luminescence exhibited bulk-insulating and gapless characteristics bounded by the bulk band gap energy. The existence of the topologically protected surface state and the picosecond-order relaxation time of the surface carriers, which was distinguishable from the bulk response, were observed. Our results provide a practical method applicable to topological insulators under ambient conditions for device applications.
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spelling pubmed-46397282015-12-02 Optically detecting the edge-state of a three-dimensional topological insulator under ambient conditions by ultrafast infrared photoluminescence spectroscopy Maezawa, Shun-ya Watanabe, Hiroshi Takeda, Masahiro Kuroda, Kenta Someya, Takashi Matsuda, Iwao Suemoto, Tohru Sci Rep Article Ultrafast infrared photoluminescence spectroscopy was applied to a three-dimensional topological insulator TlBiSe(2) under ambient conditions. The dynamics of the luminescence exhibited bulk-insulating and gapless characteristics bounded by the bulk band gap energy. The existence of the topologically protected surface state and the picosecond-order relaxation time of the surface carriers, which was distinguishable from the bulk response, were observed. Our results provide a practical method applicable to topological insulators under ambient conditions for device applications. Nature Publishing Group 2015-11-10 /pmc/articles/PMC4639728/ /pubmed/26552784 http://dx.doi.org/10.1038/srep16443 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Maezawa, Shun-ya
Watanabe, Hiroshi
Takeda, Masahiro
Kuroda, Kenta
Someya, Takashi
Matsuda, Iwao
Suemoto, Tohru
Optically detecting the edge-state of a three-dimensional topological insulator under ambient conditions by ultrafast infrared photoluminescence spectroscopy
title Optically detecting the edge-state of a three-dimensional topological insulator under ambient conditions by ultrafast infrared photoluminescence spectroscopy
title_full Optically detecting the edge-state of a three-dimensional topological insulator under ambient conditions by ultrafast infrared photoluminescence spectroscopy
title_fullStr Optically detecting the edge-state of a three-dimensional topological insulator under ambient conditions by ultrafast infrared photoluminescence spectroscopy
title_full_unstemmed Optically detecting the edge-state of a three-dimensional topological insulator under ambient conditions by ultrafast infrared photoluminescence spectroscopy
title_short Optically detecting the edge-state of a three-dimensional topological insulator under ambient conditions by ultrafast infrared photoluminescence spectroscopy
title_sort optically detecting the edge-state of a three-dimensional topological insulator under ambient conditions by ultrafast infrared photoluminescence spectroscopy
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4639728/
https://www.ncbi.nlm.nih.gov/pubmed/26552784
http://dx.doi.org/10.1038/srep16443
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