Cargando…
Are X-rays the key to integrated computational materials engineering?
An IUCrJ paper by Levine et al. highlights the promise and challenge of 3D X-ray structural microscopy as a unique tool to test predictive models of materials behavior.
Autor principal: | Ice, Gene |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2015
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4645102/ https://www.ncbi.nlm.nih.gov/pubmed/26594365 http://dx.doi.org/10.1107/S205225251501951X |
Ejemplares similares
-
Counting on the future: fast charge-integrating detectors for X-ray nanoimaging
por: Deng, Junjing, et al.
Publicado: (2023) -
Prism-based scanning X-ray microscopy
por: Evans-Lutterodt, Kenneth
Publicado: (2021) -
Coherent three-dimensional X-ray cryo-imaging
por: Robinson, Ian
Publicado: (2015) -
Accurate H-atom parameters from X-ray diffraction data
por: Farrugia, Louis J.
Publicado: (2014) -
Speeding up enzyme engineering computationally
por: Scrutton, Nigel S.
Publicado: (2016)