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Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment

Characterization of transverse coherence is one of the most critical themes for advanced X-ray sources and their applications in many fields of science. However, for hard X-ray free-electron laser (XFEL) sources there is very little knowledge available on their transverse coherence characteristics,...

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Autores principales: Inoue, Ichiro, Tono, Kensuke, Joti, Yasumasa, Kameshima, Takashi, Ogawa, Kanade, Shinohara, Yuya, Amemiya, Yoshiyuki, Yabashi, Makina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4645106/
https://www.ncbi.nlm.nih.gov/pubmed/26594369
http://dx.doi.org/10.1107/S2052252515015523
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author Inoue, Ichiro
Tono, Kensuke
Joti, Yasumasa
Kameshima, Takashi
Ogawa, Kanade
Shinohara, Yuya
Amemiya, Yoshiyuki
Yabashi, Makina
author_facet Inoue, Ichiro
Tono, Kensuke
Joti, Yasumasa
Kameshima, Takashi
Ogawa, Kanade
Shinohara, Yuya
Amemiya, Yoshiyuki
Yabashi, Makina
author_sort Inoue, Ichiro
collection PubMed
description Characterization of transverse coherence is one of the most critical themes for advanced X-ray sources and their applications in many fields of science. However, for hard X-ray free-electron laser (XFEL) sources there is very little knowledge available on their transverse coherence characteristics, despite their extreme importance. This is because the unique characteristics of the sources, such as the ultra-intense nature of XFEL radiation and the shot-by-shot fluctuations in the intensity distribution, make it difficult to apply conventional techniques. Here, an extended Young’s interference experiment using a stream of bimodal gold particles is shown to achieve a direct measurement of the modulus of the complex degree of coherence of XFEL pulses. The use of interference patterns from two differently sized particles enables analysis of the transverse coherence on a single-shot basis without a priori knowledge of the instantaneous intensity ratio at the particles. For a focused X-ray spot as small as 1.8 µm (horizontal) × 1.3 µm (vertical) with an ultrahigh intensity that exceeds 10(18) W cm(−2) from the SPring-8 Ångstrom Compact free-electron LAser (SACLA), the coherence lengths were estimated to be 1.7 ± 0.2 µm (horizontal) and 1.3 ± 0.1 µm (vertical). The ratios between the coherence lengths and the focused beam sizes are almost the same in the horizontal and vertical directions, indicating that the transverse coherence properties of unfocused XFEL pulses are isotropic. The experiment presented here enables measurements free from radiation damage and will be readily applicable to the analysis of the transverse coherence of ultra-intense nanometre-sized focused XFEL beams.
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spelling pubmed-46451062015-11-20 Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment Inoue, Ichiro Tono, Kensuke Joti, Yasumasa Kameshima, Takashi Ogawa, Kanade Shinohara, Yuya Amemiya, Yoshiyuki Yabashi, Makina IUCrJ Research Papers Characterization of transverse coherence is one of the most critical themes for advanced X-ray sources and their applications in many fields of science. However, for hard X-ray free-electron laser (XFEL) sources there is very little knowledge available on their transverse coherence characteristics, despite their extreme importance. This is because the unique characteristics of the sources, such as the ultra-intense nature of XFEL radiation and the shot-by-shot fluctuations in the intensity distribution, make it difficult to apply conventional techniques. Here, an extended Young’s interference experiment using a stream of bimodal gold particles is shown to achieve a direct measurement of the modulus of the complex degree of coherence of XFEL pulses. The use of interference patterns from two differently sized particles enables analysis of the transverse coherence on a single-shot basis without a priori knowledge of the instantaneous intensity ratio at the particles. For a focused X-ray spot as small as 1.8 µm (horizontal) × 1.3 µm (vertical) with an ultrahigh intensity that exceeds 10(18) W cm(−2) from the SPring-8 Ångstrom Compact free-electron LAser (SACLA), the coherence lengths were estimated to be 1.7 ± 0.2 µm (horizontal) and 1.3 ± 0.1 µm (vertical). The ratios between the coherence lengths and the focused beam sizes are almost the same in the horizontal and vertical directions, indicating that the transverse coherence properties of unfocused XFEL pulses are isotropic. The experiment presented here enables measurements free from radiation damage and will be readily applicable to the analysis of the transverse coherence of ultra-intense nanometre-sized focused XFEL beams. International Union of Crystallography 2015-09-22 /pmc/articles/PMC4645106/ /pubmed/26594369 http://dx.doi.org/10.1107/S2052252515015523 Text en © Ichiro Inoue et al. 2015 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Inoue, Ichiro
Tono, Kensuke
Joti, Yasumasa
Kameshima, Takashi
Ogawa, Kanade
Shinohara, Yuya
Amemiya, Yoshiyuki
Yabashi, Makina
Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment
title Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment
title_full Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment
title_fullStr Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment
title_full_unstemmed Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment
title_short Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment
title_sort characterizing transverse coherence of an ultra-intense focused x-ray free-electron laser by an extended young’s experiment
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4645106/
https://www.ncbi.nlm.nih.gov/pubmed/26594369
http://dx.doi.org/10.1107/S2052252515015523
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