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Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment
Characterization of transverse coherence is one of the most critical themes for advanced X-ray sources and their applications in many fields of science. However, for hard X-ray free-electron laser (XFEL) sources there is very little knowledge available on their transverse coherence characteristics,...
Autores principales: | , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4645106/ https://www.ncbi.nlm.nih.gov/pubmed/26594369 http://dx.doi.org/10.1107/S2052252515015523 |
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author | Inoue, Ichiro Tono, Kensuke Joti, Yasumasa Kameshima, Takashi Ogawa, Kanade Shinohara, Yuya Amemiya, Yoshiyuki Yabashi, Makina |
author_facet | Inoue, Ichiro Tono, Kensuke Joti, Yasumasa Kameshima, Takashi Ogawa, Kanade Shinohara, Yuya Amemiya, Yoshiyuki Yabashi, Makina |
author_sort | Inoue, Ichiro |
collection | PubMed |
description | Characterization of transverse coherence is one of the most critical themes for advanced X-ray sources and their applications in many fields of science. However, for hard X-ray free-electron laser (XFEL) sources there is very little knowledge available on their transverse coherence characteristics, despite their extreme importance. This is because the unique characteristics of the sources, such as the ultra-intense nature of XFEL radiation and the shot-by-shot fluctuations in the intensity distribution, make it difficult to apply conventional techniques. Here, an extended Young’s interference experiment using a stream of bimodal gold particles is shown to achieve a direct measurement of the modulus of the complex degree of coherence of XFEL pulses. The use of interference patterns from two differently sized particles enables analysis of the transverse coherence on a single-shot basis without a priori knowledge of the instantaneous intensity ratio at the particles. For a focused X-ray spot as small as 1.8 µm (horizontal) × 1.3 µm (vertical) with an ultrahigh intensity that exceeds 10(18) W cm(−2) from the SPring-8 Ångstrom Compact free-electron LAser (SACLA), the coherence lengths were estimated to be 1.7 ± 0.2 µm (horizontal) and 1.3 ± 0.1 µm (vertical). The ratios between the coherence lengths and the focused beam sizes are almost the same in the horizontal and vertical directions, indicating that the transverse coherence properties of unfocused XFEL pulses are isotropic. The experiment presented here enables measurements free from radiation damage and will be readily applicable to the analysis of the transverse coherence of ultra-intense nanometre-sized focused XFEL beams. |
format | Online Article Text |
id | pubmed-4645106 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2015 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-46451062015-11-20 Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment Inoue, Ichiro Tono, Kensuke Joti, Yasumasa Kameshima, Takashi Ogawa, Kanade Shinohara, Yuya Amemiya, Yoshiyuki Yabashi, Makina IUCrJ Research Papers Characterization of transverse coherence is one of the most critical themes for advanced X-ray sources and their applications in many fields of science. However, for hard X-ray free-electron laser (XFEL) sources there is very little knowledge available on their transverse coherence characteristics, despite their extreme importance. This is because the unique characteristics of the sources, such as the ultra-intense nature of XFEL radiation and the shot-by-shot fluctuations in the intensity distribution, make it difficult to apply conventional techniques. Here, an extended Young’s interference experiment using a stream of bimodal gold particles is shown to achieve a direct measurement of the modulus of the complex degree of coherence of XFEL pulses. The use of interference patterns from two differently sized particles enables analysis of the transverse coherence on a single-shot basis without a priori knowledge of the instantaneous intensity ratio at the particles. For a focused X-ray spot as small as 1.8 µm (horizontal) × 1.3 µm (vertical) with an ultrahigh intensity that exceeds 10(18) W cm(−2) from the SPring-8 Ångstrom Compact free-electron LAser (SACLA), the coherence lengths were estimated to be 1.7 ± 0.2 µm (horizontal) and 1.3 ± 0.1 µm (vertical). The ratios between the coherence lengths and the focused beam sizes are almost the same in the horizontal and vertical directions, indicating that the transverse coherence properties of unfocused XFEL pulses are isotropic. The experiment presented here enables measurements free from radiation damage and will be readily applicable to the analysis of the transverse coherence of ultra-intense nanometre-sized focused XFEL beams. International Union of Crystallography 2015-09-22 /pmc/articles/PMC4645106/ /pubmed/26594369 http://dx.doi.org/10.1107/S2052252515015523 Text en © Ichiro Inoue et al. 2015 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
spellingShingle | Research Papers Inoue, Ichiro Tono, Kensuke Joti, Yasumasa Kameshima, Takashi Ogawa, Kanade Shinohara, Yuya Amemiya, Yoshiyuki Yabashi, Makina Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment |
title | Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment |
title_full | Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment |
title_fullStr | Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment |
title_full_unstemmed | Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment |
title_short | Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment |
title_sort | characterizing transverse coherence of an ultra-intense focused x-ray free-electron laser by an extended young’s experiment |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4645106/ https://www.ncbi.nlm.nih.gov/pubmed/26594369 http://dx.doi.org/10.1107/S2052252515015523 |
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