Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment

Characterization of transverse coherence is one of the most critical themes for advanced X-ray sources and their applications in many fields of science. However, for hard X-ray free-electron laser (XFEL) sources there is very little knowledge available on their transverse coherence characteristics,...

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Detalles Bibliográficos
Autores principales: Inoue, Ichiro, Tono, Kensuke, Joti, Yasumasa, Kameshima, Takashi, Ogawa, Kanade, Shinohara, Yuya, Amemiya, Yoshiyuki, Yabashi, Makina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4645106/
https://www.ncbi.nlm.nih.gov/pubmed/26594369
http://dx.doi.org/10.1107/S2052252515015523

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4645106/
https://www.ncbi.nlm.nih.gov/pubmed/26594369
http://dx.doi.org/10.1107/S2052252515015523

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