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A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies
In 2006, the National Institute of Standards and Technology conducted an assessment of the U.S. measurement system (USMS), which encompasses all private and public organizations that develop, supply, use, or ensure the validity of measurement results. As part of that assessment, NIST collaborated wi...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2009
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4651608/ https://www.ncbi.nlm.nih.gov/pubmed/27504225 http://dx.doi.org/10.6028/jres.114.017 |
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author | Bennett, Herbert S. Andres, Howard Pellegrino, Joan |
author_facet | Bennett, Herbert S. Andres, Howard Pellegrino, Joan |
author_sort | Bennett, Herbert S. |
collection | PubMed |
description | In 2006, the National Institute of Standards and Technology conducted an assessment of the U.S. measurement system (USMS), which encompasses all private and public organizations that develop, supply, use, or ensure the validity of measurement results. As part of that assessment, NIST collaborated with Energetics Incorporated to identify and authenticate 723 measurement needs that are barriers to technological innovations. A number of these measurement needs (64) are relevant to accelerating innovation and commercialization of nano-electrotechnologies. In this paper, we apply the taxonomy from a 2008 international survey that established a global consensus of priorities for standards and measurements in nano-electrotechnologies to rank in priority order the relevant 64 USMS-identified measurement needs. This paper presents a method for assigning priorities that is statistically based and represents a global consensus of stakeholders. Such a method is needed because limited resources exist to address the large number of measurement needs in nano-electrotechnologies, and the most critical measurement needs should be addressed first. |
format | Online Article Text |
id | pubmed-4651608 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2009 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-46516082016-08-08 A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies Bennett, Herbert S. Andres, Howard Pellegrino, Joan J Res Natl Inst Stand Technol Article In 2006, the National Institute of Standards and Technology conducted an assessment of the U.S. measurement system (USMS), which encompasses all private and public organizations that develop, supply, use, or ensure the validity of measurement results. As part of that assessment, NIST collaborated with Energetics Incorporated to identify and authenticate 723 measurement needs that are barriers to technological innovations. A number of these measurement needs (64) are relevant to accelerating innovation and commercialization of nano-electrotechnologies. In this paper, we apply the taxonomy from a 2008 international survey that established a global consensus of priorities for standards and measurements in nano-electrotechnologies to rank in priority order the relevant 64 USMS-identified measurement needs. This paper presents a method for assigning priorities that is statistically based and represents a global consensus of stakeholders. Such a method is needed because limited resources exist to address the large number of measurement needs in nano-electrotechnologies, and the most critical measurement needs should be addressed first. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2009 2009-08-01 /pmc/articles/PMC4651608/ /pubmed/27504225 http://dx.doi.org/10.6028/jres.114.017 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Bennett, Herbert S. Andres, Howard Pellegrino, Joan A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies |
title | A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies |
title_full | A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies |
title_fullStr | A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies |
title_full_unstemmed | A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies |
title_short | A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies |
title_sort | method for assigning priorities to united states measurement system (usms) needs: nano-electrotechnologies |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4651608/ https://www.ncbi.nlm.nih.gov/pubmed/27504225 http://dx.doi.org/10.6028/jres.114.017 |
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