Coherent interaction with two-level fluctuators using near field scanning microwave microscopy

Near field Scanning Microwave Microscopy (NSMM) is a scanning probe technique that non-invasively can obtain material properties on the nano-scale at microwave frequencies. While focus has been on developing room-temperature systems it was recently shown that this technique can potentially reach the...

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Detalles Bibliográficos
Autores principales: de Graaf, S. E., Danilov, A. V., Kubatkin, S. E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4657005/
https://www.ncbi.nlm.nih.gov/pubmed/26597218
http://dx.doi.org/10.1038/srep17176

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4657005/
https://www.ncbi.nlm.nih.gov/pubmed/26597218
http://dx.doi.org/10.1038/srep17176

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