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Coherent interaction with two-level fluctuators using near field scanning microwave microscopy
Near field Scanning Microwave Microscopy (NSMM) is a scanning probe technique that non-invasively can obtain material properties on the nano-scale at microwave frequencies. While focus has been on developing room-temperature systems it was recently shown that this technique can potentially reach the...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group
2015
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4657005/ https://www.ncbi.nlm.nih.gov/pubmed/26597218 http://dx.doi.org/10.1038/srep17176 |