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The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors
Focused electron beam induced deposition (FEBID) is a single-step, direct-write nanofabrication technique capable of writing three-dimensional metal-containing nanoscale structures on surfaces using electron-induced reactions of organometallic precursors. Currently FEBID is, however, limited in reso...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4660900/ https://www.ncbi.nlm.nih.gov/pubmed/26665061 http://dx.doi.org/10.3762/bjnano.6.194 |
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author | Thorman, Rachel M Kumar T. P., Ragesh Fairbrother, D Howard Ingólfsson, Oddur |
author_facet | Thorman, Rachel M Kumar T. P., Ragesh Fairbrother, D Howard Ingólfsson, Oddur |
author_sort | Thorman, Rachel M |
collection | PubMed |
description | Focused electron beam induced deposition (FEBID) is a single-step, direct-write nanofabrication technique capable of writing three-dimensional metal-containing nanoscale structures on surfaces using electron-induced reactions of organometallic precursors. Currently FEBID is, however, limited in resolution due to deposition outside the area of the primary electron beam and in metal purity due to incomplete precursor decomposition. Both limitations are likely in part caused by reactions of precursor molecules with low-energy (<100 eV) secondary electrons generated by interactions of the primary beam with the substrate. These low-energy electrons are abundant both inside and outside the area of the primary electron beam and are associated with reactions causing incomplete ligand dissociation from FEBID precursors. As it is not possible to directly study the effects of secondary electrons in situ in FEBID, other means must be used to elucidate their role. In this context, gas phase studies can obtain well-resolved information on low-energy electron-induced reactions with FEBID precursors by studying isolated molecules interacting with single electrons of well-defined energy. In contrast, ultra-high vacuum surface studies on adsorbed precursor molecules can provide information on surface speciation and identify species desorbing from a substrate during electron irradiation under conditions more representative of FEBID. Comparing gas phase and surface science studies allows for insight into the primary deposition mechanisms for individual precursors; ideally, this information can be used to design future FEBID precursors and optimize deposition conditions. In this review, we give a summary of different low-energy electron-induced fragmentation processes that can be initiated by the secondary electrons generated in FEBID, specifically, dissociative electron attachment, dissociative ionization, neutral dissociation, and dipolar dissociation, emphasizing the different nature and energy dependence of each process. We then explore the value of studying these processes through comparative gas phase and surface studies for four commonly-used FEBID precursors: MeCpPtMe(3), Pt(PF(3))(4), Co(CO)(3)NO, and W(CO)(6). Through these case studies, it is evident that this combination of studies can provide valuable insight into potential mechanisms governing deposit formation in FEBID. Although further experiments and new approaches are needed, these studies are an important stepping-stone toward better understanding the fundamental physics behind the deposition process and establishing design criteria for optimized FEBID precursors. |
format | Online Article Text |
id | pubmed-4660900 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2015 |
publisher | Beilstein-Institut |
record_format | MEDLINE/PubMed |
spelling | pubmed-46609002015-12-09 The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors Thorman, Rachel M Kumar T. P., Ragesh Fairbrother, D Howard Ingólfsson, Oddur Beilstein J Nanotechnol Review Focused electron beam induced deposition (FEBID) is a single-step, direct-write nanofabrication technique capable of writing three-dimensional metal-containing nanoscale structures on surfaces using electron-induced reactions of organometallic precursors. Currently FEBID is, however, limited in resolution due to deposition outside the area of the primary electron beam and in metal purity due to incomplete precursor decomposition. Both limitations are likely in part caused by reactions of precursor molecules with low-energy (<100 eV) secondary electrons generated by interactions of the primary beam with the substrate. These low-energy electrons are abundant both inside and outside the area of the primary electron beam and are associated with reactions causing incomplete ligand dissociation from FEBID precursors. As it is not possible to directly study the effects of secondary electrons in situ in FEBID, other means must be used to elucidate their role. In this context, gas phase studies can obtain well-resolved information on low-energy electron-induced reactions with FEBID precursors by studying isolated molecules interacting with single electrons of well-defined energy. In contrast, ultra-high vacuum surface studies on adsorbed precursor molecules can provide information on surface speciation and identify species desorbing from a substrate during electron irradiation under conditions more representative of FEBID. Comparing gas phase and surface science studies allows for insight into the primary deposition mechanisms for individual precursors; ideally, this information can be used to design future FEBID precursors and optimize deposition conditions. In this review, we give a summary of different low-energy electron-induced fragmentation processes that can be initiated by the secondary electrons generated in FEBID, specifically, dissociative electron attachment, dissociative ionization, neutral dissociation, and dipolar dissociation, emphasizing the different nature and energy dependence of each process. We then explore the value of studying these processes through comparative gas phase and surface studies for four commonly-used FEBID precursors: MeCpPtMe(3), Pt(PF(3))(4), Co(CO)(3)NO, and W(CO)(6). Through these case studies, it is evident that this combination of studies can provide valuable insight into potential mechanisms governing deposit formation in FEBID. Although further experiments and new approaches are needed, these studies are an important stepping-stone toward better understanding the fundamental physics behind the deposition process and establishing design criteria for optimized FEBID precursors. Beilstein-Institut 2015-09-16 /pmc/articles/PMC4660900/ /pubmed/26665061 http://dx.doi.org/10.3762/bjnano.6.194 Text en Copyright © 2015, Thorman et al. https://creativecommons.org/licenses/by/2.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms) |
spellingShingle | Review Thorman, Rachel M Kumar T. P., Ragesh Fairbrother, D Howard Ingólfsson, Oddur The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors |
title | The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors |
title_full | The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors |
title_fullStr | The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors |
title_full_unstemmed | The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors |
title_short | The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors |
title_sort | role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors |
topic | Review |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4660900/ https://www.ncbi.nlm.nih.gov/pubmed/26665061 http://dx.doi.org/10.3762/bjnano.6.194 |
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