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Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

A novel instrumentation approach to nanoindentation is described that exhibits improved resolution and depth sensing. The approach is based on a multi-probe scanning probe microscopy (SPM) tool that utilizes tuning-fork based probes for both indentation and depth sensing. Unlike nanoindentation expe...

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Autores principales: Cinar, Eyup, Sahin, Ferat, Yablon, Dalia
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4660937/
https://www.ncbi.nlm.nih.gov/pubmed/26665072
http://dx.doi.org/10.3762/bjnano.6.205
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author Cinar, Eyup
Sahin, Ferat
Yablon, Dalia
author_facet Cinar, Eyup
Sahin, Ferat
Yablon, Dalia
author_sort Cinar, Eyup
collection PubMed
description A novel instrumentation approach to nanoindentation is described that exhibits improved resolution and depth sensing. The approach is based on a multi-probe scanning probe microscopy (SPM) tool that utilizes tuning-fork based probes for both indentation and depth sensing. Unlike nanoindentation experiments performed with conventional AFM systems using beam-bounce technology, this technique incorporates a second probe system with an ultra-high resolution for depth sensing. The additional second probe measures only the vertical movement of the straight indenter attached to a tuning-fork probe with a high spring constant and it can also be used for AFM scanning to obtain an accurate profiling. Nanoindentation results are demonstrated on silicon, fused silica, and Corning Eagle Glass. The results show that this new approach is viable in terms of accurately characterizing mechanical properties of materials through nanoindentation with high accuracy, and it opens doors to many other exciting applications in the field of nanomechanical characterization.
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spelling pubmed-46609372015-12-09 Development of a novel nanoindentation technique by utilizing a dual-probe AFM system Cinar, Eyup Sahin, Ferat Yablon, Dalia Beilstein J Nanotechnol Full Research Paper A novel instrumentation approach to nanoindentation is described that exhibits improved resolution and depth sensing. The approach is based on a multi-probe scanning probe microscopy (SPM) tool that utilizes tuning-fork based probes for both indentation and depth sensing. Unlike nanoindentation experiments performed with conventional AFM systems using beam-bounce technology, this technique incorporates a second probe system with an ultra-high resolution for depth sensing. The additional second probe measures only the vertical movement of the straight indenter attached to a tuning-fork probe with a high spring constant and it can also be used for AFM scanning to obtain an accurate profiling. Nanoindentation results are demonstrated on silicon, fused silica, and Corning Eagle Glass. The results show that this new approach is viable in terms of accurately characterizing mechanical properties of materials through nanoindentation with high accuracy, and it opens doors to many other exciting applications in the field of nanomechanical characterization. Beilstein-Institut 2015-10-12 /pmc/articles/PMC4660937/ /pubmed/26665072 http://dx.doi.org/10.3762/bjnano.6.205 Text en Copyright © 2015, Cinar et al. https://creativecommons.org/licenses/by/2.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Full Research Paper
Cinar, Eyup
Sahin, Ferat
Yablon, Dalia
Development of a novel nanoindentation technique by utilizing a dual-probe AFM system
title Development of a novel nanoindentation technique by utilizing a dual-probe AFM system
title_full Development of a novel nanoindentation technique by utilizing a dual-probe AFM system
title_fullStr Development of a novel nanoindentation technique by utilizing a dual-probe AFM system
title_full_unstemmed Development of a novel nanoindentation technique by utilizing a dual-probe AFM system
title_short Development of a novel nanoindentation technique by utilizing a dual-probe AFM system
title_sort development of a novel nanoindentation technique by utilizing a dual-probe afm system
topic Full Research Paper
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4660937/
https://www.ncbi.nlm.nih.gov/pubmed/26665072
http://dx.doi.org/10.3762/bjnano.6.205
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