Direct Observation of the Biaxial Stress Effect on Efficiency Droop in GaN-based Light-emitting Diode under Electrical Injection

Light-emitting diode (LED) efficiency has attracted considerable interest because of the extended use of solid-state lighting. Owing to lack of direct measurement, identification of the reasons for efficiency droop has been restricted. A direct measurement technique is developed in this work for cha...

Descripción completa

Detalles Bibliográficos
Autores principales: Zheng, Jinjian, Li, Shuiqing, Chou, Chilun, Lin, Wei, Xun, Feilin, Guo, Fei, Zheng, Tongchang, Li, Shuping, Kang, Junyong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4669452/
https://www.ncbi.nlm.nih.gov/pubmed/26634816
http://dx.doi.org/10.1038/srep17227

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4669452/
https://www.ncbi.nlm.nih.gov/pubmed/26634816
http://dx.doi.org/10.1038/srep17227

Ejemplares similares