Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process

Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH(3)NH(3)PbI(3) (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extrac...

Descripción completa

Detalles Bibliográficos
Autores principales: Phillips, Laurie J., Rashed, Atef M., Treharne, Robert E., Kay, James, Yates, Peter, Mitrovic, Ivona Z., Weerakkody, Ayendra, Hall, Steve, Durose, Ken
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2015
Materias:
Data Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4669473/
https://www.ncbi.nlm.nih.gov/pubmed/26702423
http://dx.doi.org/10.1016/j.dib.2015.10.026
Descripción
Sumario:Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH(3)NH(3)PbI(3) (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.

Ejemplares similares