Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process

Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH(3)NH(3)PbI(3) (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extrac...

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Autores principales: Phillips, Laurie J., Rashed, Atef M., Treharne, Robert E., Kay, James, Yates, Peter, Mitrovic, Ivona Z., Weerakkody, Ayendra, Hall, Steve, Durose, Ken
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2015
Materias:
Data Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4669473/
https://www.ncbi.nlm.nih.gov/pubmed/26702423
http://dx.doi.org/10.1016/j.dib.2015.10.026
_version_ 1782404110154203136
author Phillips, Laurie J.
Rashed, Atef M.
Treharne, Robert E.
Kay, James
Yates, Peter
Mitrovic, Ivona Z.
Weerakkody, Ayendra
Hall, Steve
Durose, Ken
author_facet Phillips, Laurie J.
Rashed, Atef M.
Treharne, Robert E.
Kay, James
Yates, Peter
Mitrovic, Ivona Z.
Weerakkody, Ayendra
Hall, Steve
Durose, Ken
author_sort Phillips, Laurie J.
collection PubMed
description Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH(3)NH(3)PbI(3) (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.
format Online
Article
Text
id pubmed-4669473
institution National Center for Biotechnology Information
language English
publishDate 2015
publisher Elsevier
record_format MEDLINE/PubMed
spelling pubmed-46694732015-12-23 Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process Phillips, Laurie J. Rashed, Atef M. Treharne, Robert E. Kay, James Yates, Peter Mitrovic, Ivona Z. Weerakkody, Ayendra Hall, Steve Durose, Ken Data Brief Data Article Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH(3)NH(3)PbI(3) (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm. Elsevier 2015-11-06 /pmc/articles/PMC4669473/ /pubmed/26702423 http://dx.doi.org/10.1016/j.dib.2015.10.026 Text en © 2015 The Authors http://creativecommons.org/licenses/by/4.0/ This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Data Article
Phillips, Laurie J.
Rashed, Atef M.
Treharne, Robert E.
Kay, James
Yates, Peter
Mitrovic, Ivona Z.
Weerakkody, Ayendra
Hall, Steve
Durose, Ken
Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
title Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
title_full Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
title_fullStr Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
title_full_unstemmed Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
title_short Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
title_sort dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
topic Data Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4669473/
https://www.ncbi.nlm.nih.gov/pubmed/26702423
http://dx.doi.org/10.1016/j.dib.2015.10.026
work_keys_str_mv AT phillipslauriej dispersionrelationdataformethylammoniumleadtriiodideperovskitedepositedona100siliconwaferusingatwostepvapourphasereactionprocess
AT rashedatefm dispersionrelationdataformethylammoniumleadtriiodideperovskitedepositedona100siliconwaferusingatwostepvapourphasereactionprocess
AT treharneroberte dispersionrelationdataformethylammoniumleadtriiodideperovskitedepositedona100siliconwaferusingatwostepvapourphasereactionprocess
AT kayjames dispersionrelationdataformethylammoniumleadtriiodideperovskitedepositedona100siliconwaferusingatwostepvapourphasereactionprocess
AT yatespeter dispersionrelationdataformethylammoniumleadtriiodideperovskitedepositedona100siliconwaferusingatwostepvapourphasereactionprocess
AT mitrovicivonaz dispersionrelationdataformethylammoniumleadtriiodideperovskitedepositedona100siliconwaferusingatwostepvapourphasereactionprocess
AT weerakkodyayendra dispersionrelationdataformethylammoniumleadtriiodideperovskitedepositedona100siliconwaferusingatwostepvapourphasereactionprocess
AT hallsteve dispersionrelationdataformethylammoniumleadtriiodideperovskitedepositedona100siliconwaferusingatwostepvapourphasereactionprocess
AT duroseken dispersionrelationdataformethylammoniumleadtriiodideperovskitedepositedona100siliconwaferusingatwostepvapourphasereactionprocess

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