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Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH(3)NH(3)PbI(3) (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extrac...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4669473/ https://www.ncbi.nlm.nih.gov/pubmed/26702423 http://dx.doi.org/10.1016/j.dib.2015.10.026 |