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The graphical method for goodness of fit test in the inverse Weibull distribution based on multiply type-II censored samples

Many studies have considered a truncated and censored samples which are type-I, type-II and hybrid censoring scheme. The inverse Weibull distribution has been utilized for the analysis of life testing and reliability data. Also, this distribution is a very flexible distribution. The inverse Rayleigh...

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Detalles Bibliográficos
Autores principales: Kang, Suk-Bok, Han, Jun-Tae
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4676778/
https://www.ncbi.nlm.nih.gov/pubmed/26688782
http://dx.doi.org/10.1186/s40064-015-1554-x
Descripción
Sumario:Many studies have considered a truncated and censored samples which are type-I, type-II and hybrid censoring scheme. The inverse Weibull distribution has been utilized for the analysis of life testing and reliability data. Also, this distribution is a very flexible distribution. The inverse Rayleigh distribution and inverse exponential distribution are a special case of the inverse Weibull distribution. In this paper, we derive the approximate maximum likelihood estimators (AMLEs) of the scale parameter and the shape parameter in the inverse Weibull distribution under multiply type-II censoring. We also propose a simple graphical method for goodness-on-fit test based on multiply type-II censored samples using AMLEs.